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Force Spectroscopy

  • Christina Puckert
  • Michael J. HigginsEmail author
Chapter

Abstract

Using atomic force microscopy (AFM) in force spectroscopy (FS) mode is a powerful tool to study the fundamental surface, physicochemical and biological forces between an AFM tip and a surface, molecule or living cell of interest.

Keywords

Atomic force microscopy Force-distance curve Elastic property 

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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute/AIIM Facility, Innovation Campus Squires WayUniversity of WollongongWollongongAustralia

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