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X-Ray Reflectivity

  • Wolfgang VoegeliEmail author
Chapter

Abstract

X-ray reflectivity (XRR) is widely used for observing the structure of surfaces, thin films, and multilayers on the scale of nanometers.

Keywords

X-ray scattering Thin films Structure determination Roughness 

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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Department of PhysicsTokyo Gakugei UniversityTokyoJapan

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