Advertisement

Ultraviolet–Visible Spectrophotometry

  • Hiro AmekuraEmail author
Chapter

Abstract

UV–Vis spectrophotometry is routinely used in the quantitative chemical analysis of solutions. In this article, applications to solid-state spectroscopy are described. This method detects optical transmittance/reflectance, i.e., intensity ratios of the transmitted/reflected light from a sample to the incident monochromatic light in the visible and adjacent (near-, mid-UV, and near-infrared) ranges, viz., 190–2500 nm (0.5–6.5 eV). The spectra are usually detected by scanning the monochromator (Fig. 126.1) and provide information about electronic excitation states in solids/molecules.

Keywords

Optical transmission spectroscopy Optical reflection spectroscopy Surface plasmon resonance Nanoparticle Birefringence of elongated nanoparticles 

References

  1. 1.
    Amekura, H., Takeda, Y., and Kishimoto., N.: Criteria for surface plasmon resonance energy of metal nanoparticles in silica glass. Nucl. Instrum. Methods Phys. Res. B 222, 96–104 (2004)CrossRefGoogle Scholar
  2. 2.
    Amekura, H., Akhmadaliev, S., Zhou, S., Chen, F.: A possible new origin of long absorption tail in Nd-doped yttrium aluminum garnet induced by 15 MeV gold-ion irradiation and heat treatment. J. Appl. Phys. 119, 173104 (2016)CrossRefGoogle Scholar
  3. 3.
    Plaksin, O., Takeda, Y., Amekura, H., Kishimoto, N.: Electronic excitation and optical responses of metal-nanoparticle composites under heavy-ion implantation. J. Appl. Phys. 99, 044307 (2006)CrossRefGoogle Scholar
  4. 4.
    Amekura, H., Kono, K., Takeda, Y., Kishimoto, N.: Cupric oxide nanoparticles in SiO2 fabricated by copper-ion implantation combined with thermal oxidation. Appl. Phys. Lett. 87, 153105 (2005)CrossRefGoogle Scholar
  5. 5.
    Amekura, H., Plaksin, O.A., Kono, K., Takeda, Y., Kishimoto, N.: Production of Cu2O nanoparticles in SiO2 by ion implantation and two-step annealing at different oxygen pressures. J. Phys. D Appl. Phys. 39, 3659–3664 (2006)CrossRefGoogle Scholar
  6. 6.
    Amekura, H., Umeda, N., Takeda, Y., Kishimoto, N.: Optical transitions of Cu2O nanocrystals in SiO2 fabricated by ion implantation and two-step annealing. Appl. Phys. Lett. 89, 223120 (2006)CrossRefGoogle Scholar
  7. 7.
    Amekura, H., Umeda, N., Kono, K., Takeda, Y., Kishimoto, N., Buchal, C., Mantl, S.: Dual surface plasmon resonances in Zn nanoparticles in SiO2: an experimental study based on optical absorption and thermal stability. Nanotechnology 18, 395707 (2007)CrossRefGoogle Scholar
  8. 8.
    Amekura, H., Tanaka, M., Katsuya, Y., Yoshikawa, H., Ohnuma, M., Matsushita, Y., Kobayashi, K., Kishimoto, N.: Melting-solidification transition of Zn nanoparticles embedded in SiO2: observation by synchrotron X-ray and ultraviolet-visible-near-infrared light. J. Appl. Phys. 108, 104302 (2010)CrossRefGoogle Scholar
  9. 9.
    Quinten, M.: Optical properties of nanoparticle systems. Wiley, Weinheim (2011)CrossRefGoogle Scholar
  10. 10.
    Amekura, H., Tanaka, M., Katsuya, Y., Yoshikawa, H., Shinotsuka, H., Tanuma, S., Ohnuma, M., Matsushita, Y., Kobayashi, K., Buchal, C., Mantl, S., and Kishimoto, N.: Melting of Zn nanoparticles embedded in SiO2 at high temperatures: effects on surface plasmon resonances. Appl. Phys. Lett. 96, 023110 (2010)CrossRefGoogle Scholar
  11. 11.
    D’Orleans, C., Stoquert, J.P., Estournès, C., Cerruti, C., Grob, J.J., Guille, J.L., Haas, F., Muller, D., Richard-Plouet, M.: Anisotropy of Co nanoparticles induced by swift heavy ions. Phys. Rev. B 67, 220101 (2003)CrossRefGoogle Scholar
  12. 12.
    Amekura, H., Ishikawa, N., Okubo, N., Ridgway, M C., Giulian, R., Mitsuishi, K., Nakayama, Y., Buchal, C., Mantl, S., Kishimoto, N.: Zn nanoparticles irradiated with swift heavy ions at low fluences: optically-detected shape elongation induced by nonoverlapping ion tracks. Phys. Rev. B 83, 205401 (2011)Google Scholar
  13. 13.
    Amekura, H., Okubo, N., Ishikawa, N.: Optical birefringence of Zn nanoparticles embedded in silica induced by swift heavy-ion irradiation. Opt. Express 22, 29888–29898 (2014)CrossRefGoogle Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Photon and Ion Beam Physics GroupNational Institute for Materials Science (NIMS)TsukubaJapan

Personalised recommendations