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Time-of-Flight Secondary Ion Mass Spectrometry

  • Satoka AoyagiEmail author
Chapter

Abstract

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is one of the most powerful surface analysis methods in terms of high sensitivity, high spatial resolution imaging, and detailed chemical information.

Keywords

Secondary ion MS imaging Depth profiling Primary ion beam Fragment ion 

References

  1. 1.
    Vickerman, J.C., Briggs, D.: TOF-SIMS: Surface Analysis by Mass Spectrometry. IM Publications and SurfaceSpectra Ltd., UK (2001)Google Scholar
  2. 2.
    Vickerman, J.C.: Gilmore, I.S. (eds.), Surface Analysis—The Principle Techniques. Wiley, New York (2009)Google Scholar
  3. 3.
    Gilmore, I.S.: SIMS of organics-advances in 2D and 3D imaging and future outlook. J. Vac. Sci. Technol. A 31(5), 050819-1 (2013)CrossRefGoogle Scholar
  4. 4.
    Lee, J.L.S., Ninomiya, S., Matsuo, J., Gilmore, I.S., Seah, M.P., Shard, A.G.: Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions. Anal. Chem. 82, 98–105 (2010)CrossRefGoogle Scholar
  5. 5.
    Fletcher, J.S.: Cellular imaging with secondary ion mass spectrometry. Analyst 134, 2204–2215 (2009)CrossRefGoogle Scholar
  6. 6.
    Seki, T., Matsuo, J., Takaoka, G.H., Yamada, I.: Generation of the large current cluster ion beam. Nucl. Instrum. Methods Phys. Res. Sect. B 206, 902 (2003)CrossRefGoogle Scholar
  7. 7.
    Ninomiya, S., Nakata, Y., Ichiki, K., Seki, T., Aoki, T., Matsuo, J.: The effect of incident cluster ion energy and size on secondary ion yields emitted from Si. Nucl. Instrum. Methods Phys. Res. Sect. B 256, 493 (2007)CrossRefGoogle Scholar
  8. 8.
    Ninomiya, S., Ichiki, K., Yamada, H., Nakata, Y., Seki, T., Aoki, T., Matsuo, J.: Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams. Rapid Commun. Mass Spectrom. 23, 1601–1606 (2009)CrossRefGoogle Scholar
  9. 9.
    Moritani, K., Mukai, G., Hashinokuchi, M., Mochiji, K.: Site-specific fragmentation of polystyrene molecule using size-selected ar gas cluster ion beam. Appl. Phys. Express 2, 046001 (2009)CrossRefGoogle Scholar
  10. 10.
    Aoyagi, S., Moritani, K., Mochiji, K.: Evaluation of immobilized polypeptides with different C-terminal residues using argon gas-cluster SIMS. Surf. Interface Anal. 43, 344–349 (2011)CrossRefGoogle Scholar
  11. 11.
    Aoyagi, S., Fletcher, J.S., Sheraz (Rabbani), S., Kawashima, T., Berrueta Razo, I., Henderson, A., Lockyer, N.P., Vickerman, J.C.: Peptide structural analysis using continuous Ar cluster and C60 ion beams. Anal. Bioanal. Chem. 405, 6621–6628 (2013)CrossRefGoogle Scholar
  12. 12.
    Brunelle, A., Touboul, D., Laprevote, O.: Biological tissue imaging with time-of-flight secondary ion mass spectrometry and cluster ion sources. J. Mass Spectrom. 40, 985–999 (2005)CrossRefGoogle Scholar
  13. 13.
    Brunelle, A., Laprevote, O.: Lipid imaging with cluster time-of-flight secondary ion mass spectrometry. Anal. Bioanal. Chem. 393, 31–35 (2009)CrossRefGoogle Scholar
  14. 14.
    Sjovall, P., Johansson, B., Lausmaa, J.: Localization of lipids in freeze-dried mouse brain sections by imaging TOF-SIMS. Appl. Surf. Sci. 252, 6966–6974 (2006)CrossRefGoogle Scholar
  15. 15.
    Piehowski, P.D., Kurczy, M.E., Willingham, D., Parry, S.A., Heien, M.L., Winograd, N., Ewing, A.G.: Freeze-etching and vapor matrix deposition for TOF-SIMS imaging of single cells. Langmuir 24, 7906–7911 (2008)CrossRefGoogle Scholar
  16. 16.
    Magnusson, Y.K., Friberg, P., Sjövall, P., Malm, J., Chen, Y.: TOF-SIMS analysis of lipid accumulation in the skeletal muscle of ob/ob mice. Obesity 16(12), 2745–2753 (2008)CrossRefGoogle Scholar
  17. 17.
    Richter, K., Nygren, H., Malmberg, P., Hagenhoff, B.: Localization of fatty acids with selective chain length by imaging time-of-flight secondary ion mass spectrometry. Microsc. Res. Tech. 70, 640–647 (2007)CrossRefGoogle Scholar
  18. 18.
    Aoyagi, S., Matsuzaki, T., Takahashi, M., Sakurai, Y., Kudo, M.: Evaluation of reagent effect on skin using time-of-flight secondary ion mass spectrometry and multivariate curve resolution. Surf. Interface Anal. 44(6), 772–775 (2012)CrossRefGoogle Scholar
  19. 19.
    Lee, J.L.S., Gilmore, I.S., Fletcher, I.W., Seah, M.P.: Multivariate image analysis strategies for TOF-SIMS images with topography. Surf. Interface Anal. 41(8), 653–665 (2009)CrossRefGoogle Scholar
  20. 20.
    Zhou, C., Qi, K., Wooley, K.L., Walker, A.V.: Time-of-flight secondary ion mass spectrometry, fluorescence microscopy and scanning electron microscopy: combined tools for monitoring the process of patterning and layer-by-layer assembly of synthetic and biological materials. Colloids Surf. B Biointerfaces 65(1), 85–91 (2008)CrossRefGoogle Scholar
  21. 21.
    Lau, Y.T.R., Schultz, J.M., Weng, L.T., Ng, K.M., Chang, C.M.: Control of the fold surface conformation of the lamellae of an oligomer. Langmuir 25, 8263–8267 (2009)CrossRefGoogle Scholar
  22. 22.
    Bertrand, P.: Static SIMS for analysis of molecular conformation and orientation. Appl. Surf. Sci. 252, 6986–6991 (2006)CrossRefGoogle Scholar
  23. 23.
    Leufgen, K., Mutter, M., Vogel, H., Szymczak, W.: Orientation modulation of a synthetic polypeptide in self-assembled monolayers: A TOF-SIMS study. J. Am. Chem. Soc. 125, 8911–8915 (2003)CrossRefGoogle Scholar
  24. 24.
    Marletta, G., Catalano, S.M., Pignataro, S.: Chemical reactions induced in polymers by keV ions, electrons and photons. Surf. Interface Anal. 16, 407–411 (1990)CrossRefGoogle Scholar
  25. 25.
    Yokoyama, Y., Aoyagi, S., Fujii, M., Matsuo, J., Fletcher, J.S., Lockyer, N.P., Vickerman, J.C., Passarelli, M., Havelund, R., Seah, M.P.: Peptide fragmentation and surface structural analysis by means of TOF-SIMS using large cluster ion sources. Anal. Chem. 88, 3592–3597 (2016)CrossRefGoogle Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Department of Materials and Life ScienceSeikei UniversityTokyoJapan

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