Interfaces Under Laser Irradiation pp 55-65 | Cite as
Short-Pulse Surface Interactions
Chapter
Abstract
The picosecond era in laser pulse generation and measurement began in 1966 with the appearance of mode-locked lasers, soon followed by the development of non-linear techniques of time measurement. It is now possible to produce reliably pulses as short as a few tens femtoseconds. In such brief interval of time, practically the only things that move in the material universe are the electrons in atoms, molecules or solids. These ultrashort pulses permit for the first time direct time-resolved studies of extremely rapid phenomena previously indirectly inferred from spectral measurements.
Keywords
Fumed Silica Pump Pulse Optical Pulse Probe Pulse Saturable Absorber
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References
- 1.C.V. Shank and E.P. Ippen, 121, Topics in Appl. Phys. 1 edited by F.P. Schäfer, Springer-Verlag (1973)Google Scholar
- 2.R.L. Fork, B.I. Greene and C.V. Shank, Appl. Phys. Lett. 41, 671 (1981)CrossRefGoogle Scholar
- 3.C.V. Shank and E.P. Ippen Appl. Phys. Lett. 26, 62 (1975)Google Scholar
- 4.C.V. Shank, Science, 219, 1027 (1983)CrossRefGoogle Scholar
- 5.W.H. Knox, M.C. Downer, R.L. Fork C.V. Shank, Optics Lett. 9 552 (1984)CrossRefGoogle Scholar
- 6.C.V. Shank, R.L. Fork, R. Yen, R.H. Stolen and W.J. Tomlinson, Appl. Phys. Lett.Google Scholar
- 7.A. Migus, A. Antonetti, J. Etchepare, D. Huhn and J. Orszag, J. Opt. Soc. Am. B 2 584 (1985)CrossRefGoogle Scholar
- 8.R.L. Fork, C.V. Shank, R. Yen, C. Hirliman, IEEE J. Quantum Electron. QE19, 500 (1983)Google Scholar
- 9.D. Hulin, M. Combescot, J. Bok, A. Migus, J.Y. Vinet, A. Antonetti Phys. Rev. Lett. 52, 1998 (1984)Google Scholar
- 10.M. Combescot and J. Bok, Phys. Rev. Lett. 48, 1413 (1982)CrossRefGoogle Scholar
- 11.D. Hulin, A. Migus, C. Tanguy and A. Antonetti, J. Lum. 30, 262 (1985)CrossRefGoogle Scholar
- 12.C.V. Shank, R.T. Yen and C. Hirliman, Phys. Rev. Lett. 50, 454 (1983)CrossRefGoogle Scholar
- 13.K.M. Shvarev, B.A. Baum, P.V. Gel’d, Sov. Phys. Sol. State, 16, 2111 (1975)Google Scholar
- 14.D. von der Linde and N. Fabricius, Appl. Phys. Lett. 41, 991 (1982)CrossRefGoogle Scholar
- 15.D.Y. Sheng, R.M. Walser, M.F. Becher, J.G. Ambrose, Appl. Phys. Lett. 39, 99 (1981)Google Scholar
- 16.S. Williamson, G. Mourou, J.C.M. Li, Phys. R-ev. Lett. 53, 1837 (1984)CrossRefGoogle Scholar
- 17.C.V. Shank, R.T. Yen, and C. Hirliman, Phys. Rev. Lett. 51, 900 (1983)CrossRefGoogle Scholar
- 18.- N. Bloembergen, R.K. Chang, S.S.Hha and C.H. Lee, Phys. Rev. Lett. 174, 813 (1968)Google Scholar
- 19.N. Bloembergen and Y.R. Shen, Phys. Rev. 141, 298 (1966)CrossRefGoogle Scholar
- 20.E.J. Heilweil, M.P. Casassa, R.R. Cavanagh and J.C. Stephenson, J. Chem. Phys. 82, 5216 (1985)CrossRefGoogle Scholar
- E.J. Heilweil, M.P. Casassa, R.R. Cavanagh and J.C. Stephenson, J. Chem. Phys. 84, 2361 (1986)CrossRefGoogle Scholar
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