Quantitative Determination of Light Elements in Semiconductor Matrices by Charged Particle Activation Analysis

  • P. Misaelides
Chapter
Part of the NATO ASI Series book series (NSSE, volume 283)

Abstract

This contribution presents the theoretical basis and the methodology of application of the Charged Particle Activation Analysis (CPAA) for the determination of trace amounts of light elements in semiconductor matrices.

Keywords

Nuclear Reaction Light Element Compound Nucleus Perturbed Angular Correlation Radiochemical Separation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media Dordrecht 1995

Authors and Affiliations

  • P. Misaelides
    • 1
  1. 1.Department of ChemistryAristotle UniversityThessalonikiGreece

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