Abstract
A kinetic analysis is made of the growth velocities of a variety of phenomena involving the growth of silicon: solid phase epitaxy, melting and solidification, vapor-liquid-solid growth, solid-liquid-solid growth, thermomigration of liquid metal droplets, and metal-mediated crystallization in the solid state. In a few cases the maxi mum interface-limited growth rate could be determined; in most cases only lower limits could be established. In all cases the proximity of a metallic phase to the interface enhanced the maximum interface-limited growth rate by several orders of magnitude over the solid phase epitaxial growth rate at the same temperature.
Keywords
Amorphous Phase Growth Velocity Liquid Alloy Metallic Phase Droplet Velocity
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