Materials aspects and implementation of silicides for ULSI
Abstract
Silicides have been a topic of intensive research for more than a decade. Driving force for these investigations has been certainly the interesting materials aspects of the silicides and the possibility of their application in integrated circuits. An extensive review of the materials properties of silicides is given in ref.1. The most interesting group of silicides in view of this paper are the transition metal silicides. Experiments have been performed to understand the silicidation reaction, its stability with respect to dopants, chemical ambient and temperature, and to conceive kinetic and thermodynamic characteristics. The resulting fundamental understanding has been crucial for implementation of silicides in integrated circuits.
Keywords
Sheet Resistance Leakage Current Density Rapid Thermal Processing Junction Depth Specific Contact ResistancePreview
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References
- 1.M.-A. Nicolet and S.S. Lau, in: VLSI Electronics, Microstructure Science, eds. N.G. Einspruch and G.B. Larrabee (Academic Press, New York, 1983), Vol. 6, p. 330.Google Scholar
- 2.F.M. d’Heurle and P. Gas, J. Mater. Res. 1 (1986) 205.CrossRefGoogle Scholar
- 3.G.J. van Gurp, W.F. van der Weg and D. Sigurd, J. Appl. Phys. 49 (1978) 4011.CrossRefGoogle Scholar
- 4.C.M. Comrie and J.E. McLeod, these proceedings.Google Scholar
- 5.Robert Beyers, J. Appl. Phys. 56 (1984) 147.CrossRefGoogle Scholar
- 6.R.W. Mann, C.A. Racine and R.S. Rass, Mat. Res. Soc. Proc, Vol. 224 (1991)115.CrossRefGoogle Scholar
- 7.C. M. Osburn, Q. Wang, M. Kellam, C. Canovai, P.L. Smith, G.E. McGuire, Z.G. Xiao and G.A. Rozgonyi, to be published in Appl. Surf. Sci.Google Scholar
- 8.R. Schreutelkamp and K. Maex, to be published.Google Scholar
- 9.S.P. Ashburn and M.C. Öztürk, these proceedings.Google Scholar
- 10.K. Maex, G. Ghosh, V. Probst, P. Lippens, L. Van den hove, L. Delaey and R.F. De Keersmaecker, J. Mater. Res. 4 (1989) 1209.CrossRefGoogle Scholar
- 11.K. Maex, G. Ghosh, L. Delaey, R.F. De Keersmaecker and V. Probst, J. Appl. Phys. 66 (1989) 5327.CrossRefGoogle Scholar
- 12.V. Probst, P. Lippens, L. Van den hove, K. Maex, H. Schaber and R. De Keersmaecker in: Proc. European Solid State Device Research Conference (ESSDERC), Bologna, Italy, 1987, eds. G. Soncini and P.U. Calzolari, p.397.Google Scholar
- 13.V. Probst, H. Kabza and H. Goebel, in: Proc. European Solic State Device Research Conference (ESSDERC), Montpellier, France, Vol.49, Eds. J.-P. Nougier and D. Gasquet (Les Editions Physique, Les Ullis, 1988), p. C4-175.Google Scholar
- 14.V. Probst, H. Schaber, P. Lippens, L. Van den hove and R. De Keersmaecker, Appl. Phys. Lett. 52 (1988) 1803.CrossRefGoogle Scholar
- 15.P. Lippens, K. Maex, L. Van den hove and R. De Keersmaecker, Nucl. Instr. Meth. Phys. Res. B 39 (1989) 330.CrossRefGoogle Scholar
- 16.P. Gas, V. Deline, F.M. d’Heurle, A. Michel and G. Scilla, J. Appl. Phys. 66 (1989) 5327.CrossRefGoogle Scholar
- 17.V. Probst, H. Schaber, A. Mitwalsky, H. Kabza, B. Hofmann, K. Maex and L. Van den hove, J. Appl. Phys. 70 (1991) 693.CrossRefGoogle Scholar
- 18.V. Probst, H. Schaber, A. Mitwalsky, H. Kabza, L. Van den hove and K. Maex, J. Appl. Phys. 70 (1991) 708.CrossRefGoogle Scholar
- 19.R. Beyers, B. Coulman and P. Merchant, J. Appl. Phys. 61 (1987) 430.Google Scholar
- 20.L. Van den hove, K. Maex, L. Hobbs, P. Lippens, R. De Keersmaecker, V. Probst and H. Schaber, Appl. Surf. Sci. 38 (1989) 430.CrossRefGoogle Scholar
- 21.P. Fahey, P.B. Griffin and J.D. Plummer, Rev. Mod. Phys., Vol. 61 (1989) 289.CrossRefGoogle Scholar
- 22.K. Maex, R. De Keersmaecker, C. Claeys, J. Vanhellemont and P.F.A. Alkemade, in: Proc. Electrochem. Soc. Symp. on Silicon Materials, Science and Technology: Semiconductor Silicon, Vol., 86-4, eds. H. Huff, T. Abe and B. Kolbesen (Electrochemical Society, Pennington, NJ, 1986), p. 346.Google Scholar
- 23.D.S. Wen, P.L. Smith, C.M. Osburn and G.A. Rozgonyi, Appl. Phys. Lett. 51 (1987) 1182.CrossRefGoogle Scholar
- 24.K. Maex and L. Van den hove, Mater. Sci. Eng. B 4 (1989) 321.CrossRefGoogle Scholar
- 25.G. A. Rozgonyi and J.W. Honeycutt, Mater. Res. Soc. Symp. Proc. 148 (1989) 3.CrossRefGoogle Scholar
- 26.J.W. Honeycutt and G.A. Rozgonyi, in: Proc. 1st Intern. Workshop on Measurement and Characterization of Ultra-Shallow Doping Profiles, North Carolina, March 1991, to be published.Google Scholar
- 27.J.W. Honeycutt and G.A. Rozgonyi, Appl. Phys. Lett. 58 (1991) 1.CrossRefGoogle Scholar
- 28.P.M. Fahey and M. Wittmer, Mater. Res. Soc. Symp. Proc. 163 (1989) 529.CrossRefGoogle Scholar
- 29.J. Vanhellemont, L. Van den hove and C. Claeys, J. Appl. Phys. 61 (1987) 2170, 2176.CrossRefGoogle Scholar
- 30.L. Van den hove, J. Vanhellemont, R. Wolters, W. Claassen, R. De Keersmaecker and G. Declerck, Proc. Int. Symp. on Materials for ULSI, Electrochemical Society, Pennington, NJ, 1988.Google Scholar
- 31.F.M. d’Heurle, A. Cros, R.D. Frampton and E.A. Irene, Phil. Mag. B, 55 (1987) 291.CrossRefGoogle Scholar
- 32.K. Maex, L. P. Hobbs and W. Eichhammer, Symp on ULSI, May 1991, Electrochemical Society, to be published.Google Scholar
- 33.D. Sadana, E. Meyers, J. Liu, T. Finstead and G. Rozgonyi, Mat. Res. Soc. Symp. Proc. Vol. 23, (1983) 203.CrossRefGoogle Scholar
- 34.B. Davari, D. Honore, G. Scilla and G. Sai-Halasz, Mat. Res. Soc. Symp. Proc, Vol. 128 (1989) 635.Google Scholar
- 35.L.P. Hobbs and K. Maex, to be published.Google Scholar
- 36.D.S. Wen, P.L. Smith, C.M. Osburn and G.A. Rozgonyi, J. Electrochem. Soc., 136 (1989) 466.CrossRefGoogle Scholar
- 37.H. Jiang, PhD. thesis, The Royal Institute of Technology, Electrum, Solid State Elect., Stockholm 1990.Google Scholar
- 38.C.M. Osburn, J. Electr. Materials, 19 (1990) 67.CrossRefGoogle Scholar
- 39.W. Eichhammer, K. Maex, W. Vandervorst and K. Elst, to be published in Appl. Surf. Sci.Google Scholar
- 40.H. Norström, K. Maex and P. Vandenabeele, J. Vac. Sc. Technol. B 8 (1990) 1223.CrossRefGoogle Scholar
- 41.H. Norström, K. Maex and P. Vandenabeele, Thin Solid Films 198 (1991) 53.CrossRefGoogle Scholar
- 42.H. Norström, K. Maex, A. Romano-Rodriguez, J. Vanhellemont and L. Van den hove, Micro-Electron. Eng. 14 (1991) 327.CrossRefGoogle Scholar
- 43.L. P. Hobbs and K. Maex, to be published in Appl. Surf. Sci.Google Scholar
- 44.Peter Vandenabeele and Karen Maex, Mat. Res. Soc. Proc. Vol 224 (1991) 185.CrossRefGoogle Scholar
- 45.W. Eichhammer, P. Vandenabeele and K. Maex, Mat. Res. Soc. Proc. Vol 224 (1991) 487Google Scholar
- 46.A. E. White, K.T. Short, R.C. Dynes, J.P. Garno and J.M. Gibson, Appl. Phys. Lett. 50 (1987) 95.CrossRefGoogle Scholar
- 47.Alice E. White, K.T. Short, Karen Maex, R. Hull, Yong-Fen Hsieh, S. A. Audet, K. W. Goossen, D.C. Jacobson and J.M. Poate, Nucl. Instr.&Meth. B 59/60 (1991) 693.CrossRefGoogle Scholar
- 48.D.J. Oostra, D.E.W. Vandenhoudt, C.W.T. Bulle-Lieuwma and E.P. Naburgh, Appl. Phys. Lett. 59 (1991) 1737.CrossRefGoogle Scholar
- 49.K. Radermacher, S. Mantl, Ch. Dieker and H. Lüth, Appl. Phys. Lett. 59 (1991) 2145.CrossRefGoogle Scholar
- 50.K. Radermacher, S. Mantl, R. Apetz, Ch. Dieker and H. Lüth, these proceedings.Google Scholar
- 51.Karen Maex, Mat. Res. Soc. Symp. Proc, Vol. 181 (1990) 111.CrossRefGoogle Scholar
- 52.K. Maex, G. Brijs, J. Vanhellemont and W. Vandervorst, Nucl. Instr. & Meth. B 59/60 (1991) 660.CrossRefGoogle Scholar