Optimum Scales and Limits of Integration

  • Daniel V. McCaughan
Part of the NATO ASI Series book series (NSSE, volume 142)

Abstract

The usefulness and viability of silicon technology is viewed with totally different eyes by the final system user, who has to supply (usually in severe time constraints), systems generated to perform to what are often severe environmental and speed/power limitations, by the inventor or developer of the technology who usually sees its virtues through “rose-tinted” spectacles, and ignores its problems, and by the realist in the middle who is constrained by the conflicting necessities of procurement for forward use, guaranteed sources of supply, and sufficient innovation to ensure technical performance and price competitiveness.

Keywords

Contact Resistance Logic Gate Systolic Array Static Random Access Memory Nodal Capacitance 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Kluwer Academic Publishers 1988

Authors and Affiliations

  • Daniel V. McCaughan
    • 1
  1. 1.Marconi Electronic Devices LimitedUK

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