In-Situ Processing Combining MBE, Lithography and Ion Implantation
Chapter
Abstract
The current interest in the physics of low dimensionality has required a re-examination of the techniques for microfabrication developed originally for the fabrication of semiconductor integrated circuits. The new requirements place great emphasis on the growth of layers of high purity, crystalline perfection within the layer, a very small degree of crystalline mismatch between layers and controlled and predictable surface properties. Additionally, stringent requirements have been placed on layer thickness, layer composition and electrical, optical and mechanical properties. At present the only viable means for producing such layers is molecular beam epitaxy (MBE).
Keywords
Molecular Beam Epitaxy Layer Growth Molecular Beam Epitaxy System Registration Mark Layer Growth Process
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© Martinus Nijhoff Publishers 1988