Advice Project: Final Balance and Future Perspectives

  • M. Melgara
  • I. Whyte
  • Y. J. Vernay
  • F. Boland
  • B. Courtois
Conference paper

Abstract

The increase of the complexity of present IC and the evolution of the technological design rules have enhanced the request of new techniques to evaluate the real behaviour of VLSI circuits. E-beam based techniques have shown to be a winning approach to examine the internal electrical and logical status of the circuit. The Scanning Electron beam Microscope can be really useful in IC debugging procedures if it is deeply integrated with the design environment. The ESPRIT Project 271 ADVICE1 aimed to automate the electron beam tester, creating a link toward the design data. The foreground of the project is going to be a commercial product. Furthermore the basis for new researches have been established.

Keywords

Beam Test Advice System VLSI Circuit Diagnostic Task Advice Project 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© ECSC, EEC, EAEC, Brussels and Luxembourg 1989

Authors and Affiliations

  • M. Melgara
    • 1
  • I. Whyte
    • 2
  • Y. J. Vernay
    • 3
  • F. Boland
    • 4
  • B. Courtois
    • 5
  1. 1.CSELTTorinoItaly
  2. 2.BTRLIpswichUK
  3. 3.CNETGrenobleFrance
  4. 4.TCDUDublinIreland
  5. 5.IMAGGrenobleFrance

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