Fluorescence Microscopy and Spectroscopy by Scanning Near-Field Optical/Atomic Force Microscope (SNOM-AFM)

  • Masamichi Fujihira
Chapter
Part of the NATO ASI Series book series (NSSE, volume 319)

Abstract

We developed a new scanning near-field optical microscope (scanning near-field optical/atomic-force microscope; SNOM-AFM). In SNOM-AFM, we took advantage of non-contact atomic force microscopy (AFM) to control the tip-sample distance for scanning near-field optical microscopy (SNOM) without mechanical damages of the tip and sample surfaces. By the precise control of the distance of the optical fiber tip within 100 nm from the sample surface, we succeeded in observing fluorescence micrographs and also fluorescence spectra for localized micro-areas of various samples. These results observed previously will be summarized in this review.

Keywords

Atomic Force Microscopy Dark Spot Evanescent Wave Optical Fiber Probe Polystyrene Sphere 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Lösche, M. & H. Möhwald, H. Rev. Sci. Instrum., 55, 1968 (1984).ADSCrossRefGoogle Scholar
  2. 2.
    Weis, R. M. & McConnell, H. M. Nature 310, 47 (1984).ADSCrossRefGoogle Scholar
  3. 3.
    Fujihira, M., Mishiyama, K., Hamaguchi, Y. & Tatsu, Y Chem. Lett., 1987, 253 (1987).CrossRefGoogle Scholar
  4. 4.
    Honig, D. & Möbius, D. J. Phys. Chem., 95, 4590 (1991).CrossRefGoogle Scholar
  5. 5.
    Henon, S. & Meunier, J. Rev. Sci. Instrum., 62, 936 (1991).ADSCrossRefGoogle Scholar
  6. 6.
    Ries, Jr., H. E. & Kimball, W. A. J. Phys. Chem., 59, 94 (1955); Nature, 181, 901(1958).CrossRefGoogle Scholar
  7. 7.
    Fryer, J. R., Hann, R. A. & Eyres, B. L. Nature, 313, 382 (1985).ADSCrossRefGoogle Scholar
  8. 8.
    Barraud, A., Leloup, J., Maire, R & Ruaudel-Teixier, A. Thin Solid Films, 133, 133 (1985).ADSCrossRefGoogle Scholar
  9. 9.
    Smith, D. R E., Bryant, A., Quate, C. F., Rabe, J. P., Gerber, C. & Swalen, J. D. Proc. Natl Acad. Sci. USA, 84, 969 (1987).ADSCrossRefGoogle Scholar
  10. 10.
    Meyer, E., Howald, L., Overney, R. M., Heinzelmann, H., Frommer, J., Güntherodt, H.-J., Wagner, T., Schier, H. & Roth, S. Nature, 349, 398 (1991).ADSCrossRefGoogle Scholar
  11. 11.
    Bourdieu, L., Silberzan, P. & Chatenay, D. Phys. Rev. Lett., 67, 2029 (1991).ADSCrossRefGoogle Scholar
  12. 12.
    Meyer, E., Overney, R., Brodbeck, D., Howald, L., Llithi, R., Frommer, J. & Güntherodt, H.-J. Phys. Rev. Lett., 69, 1777 (1992).ADSCrossRefGoogle Scholar
  13. 13.
    Overney, R. M., Meyer, E., Frommer, J., Brodbeck, D., Lüthi, R., Howald, L., Güntherodt, H.-J., Fujihira, M., Takano, H. & Gotoh, Y. Nature, 359, 133 (1992).ADSCrossRefGoogle Scholar
  14. 14.
    Meyer, E., Overney, R., Lüthi, R., Brodbeck, D., Howald, L., Frommer, J. Güntherodt, H.-J., Wolter, O., Fujihira, M., Takano H. & Gotoh, Y. Thin Solid Films, 220, 132 (1992).ADSCrossRefGoogle Scholar
  15. 15.
    Fujihira, M. & Morita, Y. J. Vac. Sci. Technol., B12, 1609 (1994).Google Scholar
  16. 16.
    Frommer, J. Angew, Chem., Int. Ed., 31, 1298 (1992).CrossRefGoogle Scholar
  17. 17.
    Fujihira, M. In Forces in Scanning Probe Methods. Güntherodt, H.-J., Anselmetti, D., Meyer, E., Eds., Kluwer Academic Publishers: NATO ASI Series E: Applied Sciences, Vol. 286, p. 567, 1995.Google Scholar
  18. 18.
    Fujihira, M., Kawate, H. & Yasutake, M. Chem. Lett., 1992, 2223 (1992).CrossRefGoogle Scholar
  19. 19.
    Fujihira, M. & Kawate, H. Thin Solid Films, 242, 163 (1994).ADSCrossRefGoogle Scholar
  20. 20.
    Fujihira, M. & Kawate, H. J. Vac. Sci. Technol., B12, 1604 (1994).Google Scholar
  21. 21.
    New Techniques of Optical Microscopy and Micro spectroscopy, Cherry, R. J., Ed., In Topics in Molecular and Structural Biology, Vol. 15, Macmillan Press: Hampshire, 1991.Google Scholar
  22. 22.
    See e.g., Near Field Optics, Pohl, D. W., Courjon, D., Eds., NATO ASI Series, Kluwer. Dordrecht, 1993, and references therein.Google Scholar
  23. 23.
    Lewis, A., Isaacson, M., Harootunian, A. & Murray, A. Ultramicroscopy, 13, 227 (1984).CrossRefGoogle Scholar
  24. 24.
    Pohl, D. W., Denk, W. & Lanz, M. Appl. Phys. Lett., 44, 651 (1984).ADSCrossRefGoogle Scholar
  25. 25.
    Fischer, U.Ch. J. Vac. Sci. Technol., B3, 386 (1985).Google Scholar
  26. 26.
    Harootunian, A., Betzig, E., Isaacson, M. & Lewis, A. Appl. Phys. Lett., 49, 647 (1986).CrossRefGoogle Scholar
  27. 27.
    Betzig, E., Lewis, A., Harootunian, M., Isaacson, M. & Kratschmer, E. Biophys. J., 49, 269 (1986).CrossRefGoogle Scholar
  28. 28.
    Lieberman, K., Harush, S., Lewis, A. & Kopelman, R. Science, 247, 59 (1990).ADSCrossRefGoogle Scholar
  29. 29.
    Courjon, D., Sarayeddine, K. & Spajer, M. Opt. Commun., 71, 23 (1989).ADSCrossRefGoogle Scholar
  30. 30.
    Reddik, R. C., Warmack, R. J. & Ferrell, T. L. Phys. Rev., B39, 767 (1989).ADSGoogle Scholar
  31. 31.
    De Fornel, F., Goudonnet, J. P., Salomon, L. & Lesniewska, E. Proc. SPIE, 1139, 77(1989).Google Scholar
  32. 32.
    Düng, U., Pohl, D. W. & Rohner, F. J. Appl. Phys., 59, 3318 (1986).ADSCrossRefGoogle Scholar
  33. 33.
    Betzig, E., Finn, P. L., Weiner, J. S. Appl. Phys. Lett., 60, 2484 (1992).ADSCrossRefGoogle Scholar
  34. 34.
    Toledo-Crow, R., Yang, P. C., Chen, Y. & Vaez-Iravani, M. Appl. Phys. Lett., 60, 2957 (1992).ADSCrossRefGoogle Scholar
  35. 35.
    Betzig, E. & Trautman, J. K. Science, 257, 189 (1992).ADSCrossRefGoogle Scholar
  36. 36.
    Betzig, E. & Chichester, R. J. Science, 262, 1422 (1993).ADSCrossRefGoogle Scholar
  37. 37.
    Tarrach, G. Bopp, M. A., Zeisel, D. & Meixner, A. J. Rev. Sci. Instrum., 66, 3569 (1995).ADSCrossRefGoogle Scholar
  38. 38.
    Dunn, R. C., Allen, E. V., Joyce, S. A., Anderson, G. A. & Xie, X. S. Ultramicroscopy, 57, 113 (1995).CrossRefGoogle Scholar
  39. 39.
    Dunn, R. C., Holtom, G. R., Mets, L. & Xie, X. S. J. Phys. Chem., 98, 3094 (1994)..CrossRefGoogle Scholar
  40. 40.
    Xie, X. S. & Dunn. R. C. Science, 265, 361 (1994).ADSCrossRefGoogle Scholar
  41. 41.
    Ambrose, W. P., Goodwin, P. M., Martin, J. C. & Keller, R. A. Proc. SPIE, 2125, 2(1994).ADSGoogle Scholar
  42. 42.
    Van Hülst, N. F., Moers, M. H. P., Noordman, O. F. J., Faulkner, T., Segerink, F. B., Van der Werf, K. O., De Grooth, B. G. & Böiger, B. Proc. SPIE, 1639, 36 (1992).ADSCrossRefGoogle Scholar
  43. 43.
    Fujihira, M., Monobe, H., Muramatsu, H. & Ataka, T: Chem. Lett., 1994, 657CrossRefGoogle Scholar
  44. 44.
    Muramatsu, H., Chiba, N., Ataka, T., Monobe, H. & Fujihira, M. Ultramicroscopy, 57, 141 (1995).CrossRefGoogle Scholar
  45. 45.
    Muramatsu, H., Chiba, N., Homma, K., Nakajima, K., Ataka, T., Ohta, S., Kusumi, A., & Fujihira, M. Appl. Phys. Lett., 66, 3245 (1995).ADSCrossRefGoogle Scholar
  46. 46.
    Fujihira, M., Monobe, H., Muramatsu, H. & Ataka, T. Ultramicroscopy, 57, 118, (1995).CrossRefGoogle Scholar
  47. 47.
    Chiba, N., Muramatsu, H., Ataka, T. & Fujihira, M. J. J. Appl. Phys., 34, 321 (1995).ADSGoogle Scholar
  48. 48.
    Fujihira, M., Monobe, H., Yamamoto, N., Muramatsu, H., Chiba, N., Nakajima, K. & Ataka, T. Ultramicroscopy, in press.Google Scholar
  49. 49.
    Fujihira, M., Sakomura, M., Aoki, D. & Koike, A. Thin Solid Films, in press.Google Scholar
  50. 50.
    Fujihira, M., Do, L. M., Koike, A. & Han, E. M. Appl. Phys. Lett., in press.Google Scholar
  51. 51.
    Meyer, G. & Amer, N. M. Appl. Phys. Lett., 53, 1045, 2400 (1988).ADSCrossRefGoogle Scholar
  52. 52.
    Alexander, S., Hellemans, L., Marti, O., Schneir, J., Elings, V., Hansma, P. K., Longmire, M. & Gurley, J. J. Appl. Phys., 65, 164 (1989).CrossRefGoogle Scholar
  53. 53.
    Martin, Y., Williams, C. C. & Wickramasinghe, H. K. J. Appl. Phys., 61, 4723 (1987).ADSCrossRefGoogle Scholar
  54. 54.
    McClelland, G. M., Erlandsson, R., Chiang, S. in: Review of Progress in Quantitative Nondestractive Evaluation, Thompson, D. O., Chimenti, D. E., Eds., Vol. 6B, Plenum: New York, 1987, p. 307.Google Scholar
  55. 55.
    Meixner, A. J., Bopp, M. A. & Tarrach, G. Appl. Opt., 33, 7995 (1994).ADSCrossRefGoogle Scholar
  56. 56.
    Meixner, A. J., Zeisel, D., Bopp, M, A. & Tarrach, G. Opt. Eng., 34, 2324 (1995).ADSCrossRefGoogle Scholar
  57. 57.
    Fujihira, M. Advances in Chemistry Series, 240, 373 (1994).Google Scholar
  58. 58.
    Fujihira, M. In Thin Films, Ulman, A., Ed., Vol. 20, Academic Press: Boston, p. 239, 1995.Google Scholar
  59. 59.
    Tang, C. W. & Vanslyke, S. A. Appl. Phys. Lett., 51, 913 (1987).ADSCrossRefGoogle Scholar
  60. 60.
    Han, E. M., Do, L. M., Yamamoto, N. & Fujihira, M. Chem. Lett., 1995, 57 (1995).CrossRefGoogle Scholar
  61. 61.
    Han, E. M., Do, L. M., Yamamoto, N. & Fujihira, M. Thin Solid Films, in press.Google Scholar
  62. 62.
    Do, L. M., Han, E. M., Niidome, Y., Fujihira, M., Kanno, T., Yoshida, S., Maeda, A. & Ikushima, A. J. J. Appl. Phys., 76, 5118 (1994).ADSCrossRefGoogle Scholar
  63. 63.
    Do, L. M., Oyamada, N., Han, E. M., Yamamoto, N. & Fujihira, M. Thin Solid Films, in press.Google Scholar
  64. 64.
    Do, L. M, Han, E. M., Koike, A., Yamamoto, N. & Fujihira, M. to be submitted.Google Scholar
  65. 65.
    Fujihira, M. Mat. Res. Soc. Symp. Proc., 227, 47 (1992).CrossRefGoogle Scholar

Copyright information

© Kluwer Academic Publishers 1996

Authors and Affiliations

  • Masamichi Fujihira
    • 1
  1. 1.Department of Biomolecular EngineeringTokyo Institute of TechnologyYokohamaJapan

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