Laser Chemical Vapor Deposition of Titanium Nitride and Process Diagnostics With Laser Induced Fluorescence Spectroscopy

  • X. Chen
  • M. N. Azer
  • K. M. Egland
  • J. Mazumder
Part of the NATO ASI Series book series (NSSE, volume 307)

Abstract

With gaseous precursors of TiCl4, H2, and N2, titanium nitride (TiN) films have been deposited on Ti-6A1-4V alloy substrates by a cw CO2 laser chemical vapor deposition (LCVD) process. Transient Ti atomic concentration above the substrate is measured by laser induced fluorescence (LEF) spectroscopy. Surface temperature during deposition is obtained by multi-wavelength pyrometry. Stylus profilometry and Auger electron spectroscopy (AES) yield film growth rates and compositions. Relationships between the growth rate and TiCl4, H2, and N2 partial pressures are established, from which the rate-controlling reactions and activation energy are obtained.

Keywords

Auger Electron Spectroscopy Laser Induce Fluorescence Titanium Nitride Laser Chemical Vapor Deposition Laser Induce Fluorescence Spectroscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Kluwer Academic Publishers 1996

Authors and Affiliations

  • X. Chen
    • 1
  • M. N. Azer
    • 1
  • K. M. Egland
    • 1
  • J. Mazumder
    • 1
  1. 1.Center for Laser-Aided Materials Processing Department of Mechanical and Industrial EngineeringUniversity of Illinois at Urbana-ChampaignUrbanaUSA

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