Device Stability and Photo-Excited Charge-Collection Spectroscopy

Chapter
First Online:
Part of the SpringerBriefs in Physics book series (SpringerBriefs in Physics)

Abstract

Important performance factors and basic device physics of organic or inorganic-channel thin-film transistors (TFTs) are addressed before introducing the photo-excited charge collection spectroscopy (PECCS), so that systematic and in-depth understanding on the device stability issues may be naturally drawn in focus. Device architecture, device physics, and general stability issues in TFT (or field-effect transistor) are thus introduced in the initial sections, and in the last section our photon-probing technique is explained along with its own device physics.

Keywords

Thin-film transistor Device physics Mobility Subthreshold swing Stability Interface trap 
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Copyright information

© The Author(s) 2013

Authors and Affiliations

  1. 1.Institute of Physics and Applied PhysicsYonsei UniversitySeoulRepublic of Korea (South Korea)
  2. 2.Institute of Physics and Applied PhysicsYonsei UniversitySeoulRepublic of Korea (South Korea)
  3. 3.Institute of Physics and Applied PhysicsYonsei UniversityPaju-siRepublic of Korea (South Korea)

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