Using User-Defined Fit Statistic to Analyze Two-Tier Items in Mathematics

  • Hak Ping TamEmail author
  • Margaret Wu
  • Doris Ching Heung Lau
  • Magdalena Mo Ching Mok
Part of the Education in the Asia-Pacific Region: Issues, Concerns and Prospects book series (EDAP, volume 18)


The two-tier item is a relatively new item format and is gradually gaining popularity in some areas of educational research. In science education, a typical two-tier item is made up of two portions. The purpose of the first portion is to assess whether students could identify the correct concept with respect to the information stated in the item stem, while the second examines the reason they supplied to justify the option they chose in the first portion. Since the data thus collected are related in a certain way, they pose challenges regarding how analysis should be done to capture the relationship that exists between the two tiers. This chapter attempts to analyze such data by using a user-defined fit statistic within the Rasch approach. The kind of information that can be gathered will be illustrated by way of analyzing a data set in mathematics.


Word Problem Subject Matter Expert Partial Credit Data Analyst Item Pair 
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Copyright information

© Springer Science+Business Media Dordrecht 2012

Authors and Affiliations

  • Hak Ping Tam
    • 1
    Email author
  • Margaret Wu
    • 2
  • Doris Ching Heung Lau
    • 3
    • 4
  • Magdalena Mo Ching Mok
    • 5
  1. 1.Graduate Institute of Science EducationNational Taiwan Normal UniversityTaipei CityTaiwan
  2. 2.Work-based Education Research CentreVictoria UniversityMelbourneAustralia
  3. 3.Formerly Centre for Assessment Research and DevelopmentThe Hong Kong Institute of EducationTai PoHong Kong
  4. 4.The University of Hong KongHong KongHong Kong
  5. 5.Department of Psychological Studies, and Assessment Research CentreThe Hong Kong Institute of EducationTai PoHong Kong

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