Generalized Low-Voltage Circuit Techniques for Very High-Speed Time-Interleaved Analog-to-Digital Converters pp 55-74 | Cite as
Time-Interleaving: Multiplying the Speed of the ADC
Abstract
While the current minimum feature size of IC fabrication technology limits the maximum achievable speed of electronic devices, parallel or time-interleaved (TI) architectures are one of the most effective solutions to boost the maximum speed of analog interfaces at the system level [1–7]. In principle the operating speed of the TI-ADC can grow linearly by increasing the number of parallel ADC channels, however various types of mismatches among different channels create modulation tones which degrade the performance of the TI-ADC, like offset [8, 9], gain [8, 9], timing [5, 8–11] as well as bandwidth mismatches (from the sampling RC time-constant) [9, 12–14]. Those mismatch effects must be fully characterized to achieve satisfactory performance in the design of TI-ADCs.
Keywords
Mismatch Error Mismatch Effect Sampling Clock Early Design Phase Capacitor MismatchReferences
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