Abstract
This chapter introduces the applications of the Flexible Reliability Reconfigurable Array (FRRA) processors, which is presented in Sect. 3.4, in a non-von Neumann architecture, and discusses its advantages when it is used in the Internet of Things (IoT) applications. FRRA is an embodiment of the concept of embedded automaton that we introduce as an essential element for building the IoT. We will start by looking at the role played by embedded system processors and point out that employing non-von Neumann architecture is inevitable (essential) to accomplish the speed/power performance required for embedded system applications. The major target application of embedded microprocessor is the IoT, and space-born sensor applications are quoted in this chapter as examples of the IoT. Space systems are somewhat special but are typical IoT applications which require dependability as an essential feature. Another important aspect of the embedded automaton based on the FRRA architecture is the contribution of behavioral synthesis technology. Practical application implementation on the reconfigurable processor is realized with the maturity of a high-level behavioral synthesis technology called CyberWorkBench (CWB).
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Aknowledgement
The right-most surge in the Makimoto’s waves shown in [20] is considered as one of the design target of the FRRA architecture implementation and the establishment of the requirement specification because the technology trend shown by the Makimoto’s waves still holds. Authors thank Dr. Makimoto for his precious advice. We proceed the evaluation of FRRA architecture as a candidate for the Highly Flexible Super Integration (HFSI) shown in the technology trend in the waves.
Authors also thank Dr. Asai, who was Research Supervisor, CREST DVLSI Program, and staff members of JST for their arrangement of the CREST symposium of DVLSI (Dependable VLSI).
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Hihara, H. et al. (2019). Applications of Reconfigurable Processors as Embedded Automatons in the IoT Sensor Networks in Space. In: Asai, S. (eds) VLSI Design and Test for Systems Dependability. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56594-9_27
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