What is High-Resolution Transmission Electron Microscopy?

  • Nobuo Tanaka


From this chapter, we start to study high-resolution transmission electron microscopy (HRTEM), particularly on phase contrast of single atoms and atomic clusters. These are essential points of the famous Scherzer theory for HRTEM.


Spatial Frequency Scattered Wave Atomic Cluster Single Atom Amorphous Film 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


  1. Bonhomme, P., & Borichia, A. (1983). Journal of Physics D, 16, 705.CrossRefGoogle Scholar
  2. Bracewell, R. (1965). The Fourier transform and its application. New York: McGraw-Hill.Google Scholar
  3. Cowley, J. (1981). Diffraction physics. Amsterdam: North-Holland.Google Scholar
  4. Daniev, R., et al. (2001). Ultramicroscopy, 88, 243.CrossRefGoogle Scholar
  5. Glauber, R., & Schomaker, V. (1953). Physical Review, 89, 667.CrossRefGoogle Scholar
  6. Heidenrech, R. (1964). Fundamentals of transmission electron microscopy. New York: Interscience.Google Scholar
  7. Kittel, C. (1966). Introduction to solid state physics. New York: John Wiley & Sons Inc.Google Scholar
  8. Lentzen, M. (2006). Microscopy and Microanalysis, 12, 191.CrossRefGoogle Scholar
  9. Lentzen, M. (2014). Ultramicroscopy, 136, 201.CrossRefGoogle Scholar
  10. Majorovits, E., et al. (2007). Ultramicroscopy, 107, 213.CrossRefGoogle Scholar
  11. Mihama, K., & Tanaka, N. (1976). Journal of Electron Microscopy, 25, 65.Google Scholar
  12. Moliere, G. (1947), Zeitschrift für Naturforschung, 2a, 133.Google Scholar
  13. Reimer, L. (1984). Transmission electron miroscopy. Berlin: Springer.CrossRefGoogle Scholar
  14. Scherzer, O. (1949). Journal of Applied Physics, 20, 20.CrossRefGoogle Scholar
  15. Schiff, L. (1968). Quantum mechanics. New York: McGraw-Hill.Google Scholar
  16. Spence, J. (2003). High resolution electron microscopy.  Oxford: Oxford Univ. Press.Google Scholar
  17. Thon, F. (1966), Zeitschrift für Naturforschung, 21a, 476.Google Scholar
  18. Uyeda, R. (1955). Journal of the Physical Society of Japan, 10, 256.CrossRefGoogle Scholar
  19. Uyeda, R. (1977). Ultramicroscopy, 2, 205.CrossRefGoogle Scholar
  20. Yamasaki, J., et al. (2015). Ultramicroscopy, 151, 224.CrossRefGoogle Scholar
  21. Zaiman, J. M. (1979). Models of disorder. Cambridge: Cambridge Univ. Press.Google Scholar
  22. Zemlin, F., et al. (1977). Ultramicroscopy, 3, 49.CrossRefGoogle Scholar
  23. Zernike, F. (1935). Zeitschrift für Technische Physik, 16, 454.Google Scholar

Copyright information

© Springer Japan KK 2017

Authors and Affiliations

  1. 1.Nagoya UniversityNagoyaJapan

Personalised recommendations