Microbeam and Nanobeam Analysis pp 425-433 | Cite as
Determination of SPM TIP Shape Using Polystyrene Latex Balls
Abstract
In scanning probe microscopy (SPM) imaging of the structure of the tip apex at a mesoscopic scale is extremely important. The present paper offers a simple way for estimating the shape of SPM tips. A standard sample consisting of a close packed monolayer of small polystyrene latex balls is used to characterise the tip shape. The image formation process is simulated by a matrix “convolution” method and the dependence of the SPM image on the tip shape is studied by calculating images of the test sample. Real pictures taken on the same test sample were used to calculate the shape of the tip utilising the known shape and size of the latex balls.
Key words
SPM STM AFM image formation tipPreview
Unable to display preview. Download preview PDF.
References
- [1]L. P. Biro, G. I. Mark, E. Balazs, in: NATO-ASI School on Nanophase Materials (G. C. Hadjipanayis, R. W. Siegel, eds.), Klüver, 1994, pp. 205–208.Google Scholar
- [2]T. Thundat, X. Y. Zheng, S. I. Sharp, D. P. Allison, R. J. Warmack, D. C. Joy, T. L. Ferrell, Scanning Microscopy International, vol. 6, 1992, pp. 903–910.Google Scholar
- [3]A. Bottino, G. Capannelli, A. Grosso, O. Monticelli, O. Cavallerri, R. Rolandi, R. Soria, J. Membrane Sci. 1994, 95, 289.CrossRefGoogle Scholar
- [4]Z. Wang, C. Bai, C. Dai, G. Huang, P. Zhang, Y. Zhang, W. Chu, L. Qiar, Y. Wang, J. Vac. Sci. Technol.B 1994, 12, 2456.CrossRefGoogle Scholar
- [5]M. A. George, A. Burger, W. E. Collins, J. L. Davidson, A. V. Barnes, N. H. Tolk, J. Appl. Phys. 1994, 76, 4099.CrossRefGoogle Scholar
- [6]K. L. Westra, D. J. Thomson, J. Vac. Sci. Technol. B 1994, 12, 3176.CrossRefGoogle Scholar
- [7]F. Atamny, A. Baiker, Surface Sci. 1995, 323, L314.CrossRefGoogle Scholar
- [8]Y. Umehara, Y. Ogiso, K. Chihara, K. Mukusa, P. E. Russel, Rev. Sci. Instr. 1995, 66, 269.CrossRefGoogle Scholar
- [9]T. O. Glasbey, G. N. Batts, M. C. Davies, D. E. Jackson, Surface Sci. 1994, 318, L1219.CrossRefGoogle Scholar
- [10]J. S. Villarrubia, Surface Sci. 1994, 321, 287.CrossRefGoogle Scholar
- [11]J. O. Tegenfeldt, L. Montelius, Appl. Phys. Lett. 1995, 66, 1068.CrossRefGoogle Scholar
- [12]V. V. Granier, Tappi J. 1994, 77, 220.Google Scholar
- [13]PW-WAVE Advantage, Visual Numerics Inc., 1993, Suite 400, 9990 Richmond Avenue, Houston, Texas 77042, USA.Google Scholar
- [14]SXM-SHELL U. Basel, Inst. Physik, Kondensierte Materie, Switzerland.Google Scholar
- [15]Polysciences Inc., Polybead Polystyrene Microspheres.Google Scholar