Chapter

Current Challenges in Patent Information Retrieval

Volume 37 of the series The Information Retrieval Series pp 281-295

Date:

Visual Analysis of Patent Data Through Global Maps and Overlays

  • Luciano KayAffiliated withCenter for Nanotechnology in Society (CNS) – ISBER, University of California Santa Barbara Email author 
  • , Alan L. PorterAffiliated withSchool of Public Policy, Georgia Institute of Technology, Atlanta GA & Search Technologies
  • , Jan YoutieAffiliated withEnterprise Innovation Institute & School of Public Policy
  • , Nils NewmanAffiliated withIntelligent Information Services Corporation
  • , Ismael RàfolsAffiliated withIngenio (CSIC-UPV), Universitat Politècnica de ValènciaSPRU, University of Sussex

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Abstract

Visual analytics has been increasingly used to help to better grasp the complexity and evolution of scientific and technological activities over time, across science and technological areas and in organisations. This chapter presents general insights into some important fields of expertise such as mapping, network analysis and visual analytics applied to patent information retrieval and analysis. We also present a new global patent map and overlay technique and illustrative examples of its application. The concluding remarks offer considerations for future patent analysis and visualisation.

Keywords

Visual analysis Global maps Overlay maps