Visual Analysis of Patent Data Through Global Maps and Overlays

  • Luciano Kay
  • Alan L. Porter
  • Jan Youtie
  • Nils Newman
  • Ismael Ràfols
Chapter
Part of the The Information Retrieval Series book series (INRE, volume 37)

Abstract

Visual analytics has been increasingly used to help to better grasp the complexity and evolution of scientific and technological activities over time, across science and technological areas and in organisations. This chapter presents general insights into some important fields of expertise such as mapping, network analysis and visual analytics applied to patent information retrieval and analysis. We also present a new global patent map and overlay technique and illustrative examples of its application. The concluding remarks offer considerations for future patent analysis and visualisation.

Keywords

Visual analysis Global maps Overlay maps 

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Copyright information

© Springer-Verlag GmbH Germany 2017

Authors and Affiliations

  • Luciano Kay
    • 1
  • Alan L. Porter
    • 2
  • Jan Youtie
    • 3
  • Nils Newman
    • 4
  • Ismael Ràfols
    • 5
    • 6
  1. 1.Center for Nanotechnology in Society (CNS) – ISBERUniversity of California Santa BarbaraSanta BarbaraUSA
  2. 2.School of Public Policy, Georgia Institute of Technology, Atlanta GA & Search TechnologiesNorcrossUSA
  3. 3.Enterprise Innovation Institute & School of Public PolicyAtlantaUSA
  4. 4.Intelligent Information Services CorporationAtlantaUSA
  5. 5.Ingenio (CSIC-UPV)Universitat Politècnica de ValènciaValènciaSpain
  6. 6.SPRUUniversity of SussexBrightonUK

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