Mustererkennung 1987 pp 315-319 | Cite as
XRAY — An Experimental Configuration Expert System for Automatic X-ray Inspection
Conference paper
Abstract
An experimental expert system for knowledge based configuration in automatic X-ray inspection is presented. The system is able to select, arrange and adapt image analysis operators according to a given inspection task. Configured analysis sequences are presented, which automatically detect and classify flaws in cast aluminium parts. Planned developments are briefly mentioned.
Preview
Unable to display preview. Download preview PDF.
References
- [1]H.Boerner, H. Strecker, Towards Automated X-Ray Inspection, paper for a special issue of’ IEEE PAMI on Industrial Machine Vision and Computer Vision Technology (to be published)Google Scholar
- [2]B. Neumann, Wissensbasierte Konfigurierung von Bildverarbeitungssystemen, 8. DAGM-Symposium Paderborn, September/Oktober 1986, Informatik-Fachberichte 125, pp. 206 - 218CrossRefGoogle Scholar
- [3]M. Ender, C.E. Liedtke, Repraesentation der relevanten Wissensinhalte in einem selbstadaptierenden regelbasierten Bilddeutungssystem, DAGM-Symposium Paderborn, September/Oktober 1986, Informatik-Fachberichte 125, pp. 219 - 223.CrossRefGoogle Scholar
- [4]R.Cunis,A.Guenter,I.Syska, PLAKON - Ein übergreifendes Konzept zur Wissensrepräsentation und Problemlösung bei Planungs-und Konfigurierungsaufgaben,Berichte des German Chapter of the ACM, 1987,pp.406-420Google Scholar
- [5]Charles L. Forgy, OPS5 User’s Manual, Department of Computer Science, CMU, 1981Google Scholar
- [6]B.Hayes-Roth, A Blackboard Architecture for Control, Artificial Intelligence 26 (1985), pp. 251 - 321CrossRefGoogle Scholar
Copyright information
© Springer-Verlag Berlin Heidelberg 1987