Diffraction Contrast and Crystal-Structure Imaging

  • Ludwig Reimer
Chapter
Part of the Springer Series in Optical Sciences book series (SSOS, volume 36)

Abstract

A crystal can be imaged with the primary beam (bright field) or with a Bragg reflection (dark field). The local intensity depends on the thickness, resulting in thickness contours, and on the tilt of the lattice planes, resulting in bend contours, which can be described by the dynamical theory of electron diffraction. In certain cases, the intensity of a Bragg reflection depends so sensitively on specimen thickness that atomic surface steps can be observed.

Keywords

Screw Dislocation Bragg Reflection Bloch Wave Diffraction Contrast Kikuchi Line 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© Springer-Verlag Berlin Heidelberg 1993

Authors and Affiliations

  • Ludwig Reimer
    • 1
  1. 1.Physikalisches InstitutWestfälische Wilhelms-Universität MünsterMünsterGermany

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