Determination of Surface Structure by LEED

  • F. Jona
  • J. A. StrozierJr.
  • P. M. Marcus
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 2)

Abstract

After a brief review of some noteworthy recent achievements of LEED crystallography we describe two important advances in methodology. One is experimental and concerns the rapid acquisition of LEED intensity data from display-type equipment with a computer-assisted television camera. The other is theoretical and concerns the calculation of LEED intensities with a new cluster approach that offers notable advantages over the schemes presently used, especially for structures involving large numbers of atoms and for high electron energies.

Keywords

Beam Mode LEED Pattern Initial Atom Pixel Mode Fluorescent Screen 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1985

Authors and Affiliations

  • F. Jona
    • 1
  • J. A. StrozierJr.
    • 2
  • P. M. Marcus
    • 3
  1. 1.Department of Materials ScienceState University of New YorkStony BrookUSA
  2. 2.Empire State CollegeState University of New YorkStony BrookUSA
  3. 3.IBM Research CenterYorktown HeightsUSA

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