Electron-Microscopy Investigation of the Structure of Defects

  • V. A. Goncharov
  • E. V. Suvorov
Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 23)

Abstract

Since that moment when the superconducting compounds of Y-Ba-Cu-O, Bi-Sr-Ca-Cu-O, Tl-Ba-Ca-Cu-O type were discovered, the quasi-two-dimensional structure of the superconducting phases has attracted much interest. In Y-Ba-Cu-0 compounds there are twin boundaries of high bulk density, in Bi-Sr-Ca-Cu-O compounds there are structural modulations, and in the Tl-Ba-Ca-Cu-O compounds they exhibit polytypism. Up to the present time, a number of works have been devoted to the influence of these two-dimensional defects, as supposed pinning centers, on the superconducting properties and as special crystal planes where 2D and ID models of superconductivity may be realized. Since the role of quasi-2D defects on the physical properties of superconducting compounds is not yet quite clear, the study of defect structures in these materials is of significant value. In particular, the study of oxygen atoms and oxygen vacancies inside and in the vicinity of planar defects presents an especially interesting problem, since, in the majority of existing models of high-temperature superconductivity, the localization of oxygen ions is one of the basic factors affecting superconductivity parameters.

Keywords

Basal Plane Burger Vector Electron Diffraction Pattern Twin Boundary Planar Defect 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 2.1
    Y. Matsui, E. Takayama-Muromachi, K. Kato: J. Appl. Phys. 27, 27L-L353 (1988)ADSCrossRefGoogle Scholar
  2. 2.2
    T. Siegrist, S. Sunshine, O.W. Murphy, R.J. Cava, S.M. Zahurak: Phys. Rev. B. 35, 7137 (1987)ADSCrossRefGoogle Scholar
  3. 2.3
    M.A. Beno, L. Soderholm, D.W. CaponeII, D.G. Hinks, J.D. Grace, I.K. Schuller: Appl. Phys. Lett. 51, 51 (1987)ADSCrossRefGoogle Scholar
  4. 2.4
    Y. Matsui, E. Takayama-Muromachi, A. Ono, S. Horiuchi, K. Kato: Jpn. J. Appl. Phys. 27, 26L (1987)ADSCrossRefGoogle Scholar
  5. 2.5
    S. Ikeda, T. Hatano, A. Matsushita, T. Matsumoto, K. Ogawa: Jpn. J. Appl. Phys. 27, 26L (1987)ADSCrossRefGoogle Scholar
  6. 2.6
    H.W. Zandbergen, G. van Tendeloo, T. Okabe, S. Amelinckx: Phys. Stat. Sol. (a) 108, 45–71 (1987)ADSCrossRefGoogle Scholar
  7. 2.7
    G. van Tendeloo, H.W. Zandbergen, S. Amelinckx: Solid State Commun. 63, 603–606 (1987)CrossRefGoogle Scholar
  8. 2.8
    G. van Tendeloo, H.W. Zandbergen, T. Okabe, S. Amelinckx: Solid State Commun. 63, 969–972 (1987)CrossRefGoogle Scholar
  9. 2.9
    J.C. Barry: J. Electron. Micros. Tech. 8, 325–337 (1988)CrossRefGoogle Scholar
  10. 2.10
    C.J. Jou, J. Washburn: J. Mater. Res. 4, 795–801 (1989)ADSCrossRefGoogle Scholar
  11. 2.11
    G. Van Tendeloo, S. Amelinckx: J. Electron Microsc. Techn. 8, 285 (1988)CrossRefGoogle Scholar
  12. 2.12
    M. Sugiyama, R. Suyama, T. Inuzoka, H. Kubo: Jpn. J. Appl. Phys. 27, 26LI (1987)CrossRefGoogle Scholar
  13. 2.13
    T.E. Mitchell, T. Roy, R.B. Schwarz, J.F. Smith, D. Wohlleben: J. Electron. Microsc. Tech. 8, 317 (1988)CrossRefGoogle Scholar
  14. 2.14
    J.D. Jorgensen, M.A. Geno, D.G. Hinks, L. Soderhoim, K.J. Volen, R.L. Hittenman, J.D. Grace, I.K. Schuller, C.U. Segre, K. Zhang, M.S. Kleefisch: Phys. Rev. B. 36, 3608 (1987)ADSCrossRefGoogle Scholar
  15. 2.15
    K. Hiraga, D. Shindo, M. Hirabayashi, M. Kikuchi, Y. Syono: J. Electron. Microsc. 36, 261 (1987)Google Scholar
  16. 2.16
    G. Van Tendeloo, H.W. Zandbergen, S. Amelinckx: Solid State Commun. 63, 389 (1987)CrossRefGoogle Scholar
  17. 2.17
    Y. Hirotsu, Y. Nakamura, Y. Murata, S. Nagakura, T. Nishihara, M. Takata: Jpn. J. Appl. Phys. 27, 26LI (1987)Google Scholar
  18. 2.18
    J. Rabier, M.F. Denanot: J. Less-Common Metals. 164, 223–230 (1990)CrossRefGoogle Scholar
  19. 2.19
    V.S. Bobrov, V.A. Goncharov, G.A. Emel’chenko, A.P. Ivanov, R.K. Nikolaev, A.N. Izotov, J.N. Novomlinskii, Yu. A. Ossipyan, N.S. Sidorov, E.V. Suvorov, V.Sh. Shekhtman, L.N. Zavel’skaya, I.I. Zver’kova: Proc. 7th Sintec World Ceramic Congress, Sattelite Symp. HTSC, Trieste. 8, 49–54 (1990)Google Scholar
  20. 2.20
    G. Van Tendeloo, D. Broddin, H.W. Zandbergen, S. Amelinckx: Physica C. 167, 627–639 (1990)ADSCrossRefGoogle Scholar
  21. 2.21
    V. Welp, M. Grimsditch, H. You, W.Ii. Kwok, M.M. Fang, G.W. Grabtree, J.Z. Liu: Physica C. 167, 1 (1989)ADSCrossRefGoogle Scholar
  22. 2.22
    Y. Zhu, M. Suenaga, A.R. Moodenbaugh: Phil. Mag. Let. 62, 51–59 (1990)ADSCrossRefGoogle Scholar
  23. 2.23
    J.M. Tarascon, Y. Le Page, P. Bardoux, B.G. Bagley, L.H. Green, W.R. McKin- non, G.W. Hull, M. Giroud, D.M. Huang: Phys. Rev. B. 37, 9382 (1988)ADSCrossRefGoogle Scholar
  24. 2.24
    Y. Matsui, S. Takekawa, H. Nozaki, A. Umesono, E. Takayama-Muromachi, S. Horiuchi: Jpn. Appl. Phys. 27, 27L-L1244 (1988)ADSCrossRefGoogle Scholar
  25. 2.25
    Y. Matsui, H. Maeda, Y. Tanaka, Sh. Horiachi: Jpn. J. Appl. Phys. 27, 27L- L375 (1988)ADSCrossRefGoogle Scholar
  26. 2.26
    Y. Matsui, H. Maeda, Y. Tanaka, Sh. Horiuchi, Sh. Takekawa, E. Takayama- Muromachi, A. Umezono, K. Ibe: JEOL. News 26, E-21 (1988)Google Scholar
  27. 2.27
    Y. Matsui, H. Maeda, Y. Tanaka, S. Horiuchi: Jpn. J. Appl. Phys. 27, 27L-L375 (1988)ADSCrossRefGoogle Scholar
  28. 2.28
    Y. Matsui, H. Maeda, Y. Tanaka, E. Takayama-Muromachi, S. Takekawa, S. Horiuchi: Jpn. J. Appl. Phys. 27, 27L-L829 (1988)ADSCrossRefGoogle Scholar
  29. 2.29
    V.A. Gontcharov, A.B. Ermolaev, L.N. Zavel’skaya, Yu.A. Ossipyan, E.V. Suvorov: Metallophysics 13, No.4, 32–39 (1991)Google Scholar
  30. 2.30
    J. Zhu, H.Q. Ye, X.W. Lin, A.Q. He, S.Q. Feng, X. Zhu, Z.Z. Gan: Mod. Phys. Lett. B. 3, 145–150 (1989)ADSCrossRefGoogle Scholar
  31. 2.31
    H.W. Zandbergen, W.A. Groen, F.C. Mijlhoff: Physica C. 156, 325–354 (1988)ADSGoogle Scholar
  32. 2.32
    T. Kajitani, K. Kusaba, M. Kikuchi, N. Kobayashi, Y. Syono, T.B. Williams, M. Hirabayashi: Jpn. J. Appl. Phys. 27, 27L (1988)ADSCrossRefGoogle Scholar
  33. 2.33
    P.L. Gai, P. Day: Physica C. 152, 335 (1988)ADSCrossRefGoogle Scholar
  34. 2.34
    Y. Syono, K. Hiraga, N. Kobayachi, M. Kikuchi, K. Kusaba, T. Kajitani, D. Shindo, S. Hosoya, A. Tokiwa, S. Terada, Y. Moto: Jpn. J. Appl. Phys. 27, 24L (1988)CrossRefGoogle Scholar
  35. 2.35
    M.A. Subramanian, C.C. Torardi, J.C. Calabrese, J. Gopalakrishnan, K.J. Morrisey, T.R. Askew, R.B. Elippen, U. Chowdhry, A.W. Sleight: Science. 239, 1015 (1988)ADSCrossRefGoogle Scholar
  36. 2.36
    H.G. von Schnering, L. Waltz, M. Schwartz, W. Becker, M. Hartweg, T. Popp, B. Hettich, P. Muller, G. Kampf: Angewandte Chem. 27, 547 (1988)Google Scholar
  37. 2.37
    X. Zhu, O. Yin, B. Lih: Mod. Phys. Lett. B. 4, 59–62 (1990)ADSCrossRefGoogle Scholar
  38. 2.38
    X.F. Zhang, Y.F. Yan, K.K. Fung: Phil. Mag. Lett. 60, 11–16 (1989)ADSCrossRefGoogle Scholar
  39. 2.39
    V.A. Gontcharov, E.Yu. Ignat’eva, Yu.A. Ossipyan, E.V. Suvorov: Metallophys. (1992) (in press)Google Scholar
  40. 2.40
    Z.-Q. Li, H. Shen, Y. Qin, J.-Y. Jiang, J.-J. Do: Phil. Mag. Lett. 60, 123–130 (1989)ADSCrossRefGoogle Scholar
  41. 2.41
    Y. Takahashi, M. Mori, Y. Ishida: In Proc. ISNC’89, Tokyo, Jpn., pp.330–333Google Scholar
  42. 2.42
    O. Eibl: Physica C 168, 249–256 (1990)ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1993

Authors and Affiliations

  • V. A. Goncharov
  • E. V. Suvorov

There are no affiliations available

Personalised recommendations