Scanning Tunneling Microscopy and Spectroscopy

  • F. Salvan
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 22)

Abstract

Scanning Tunneling Microscopy (S.T.M.) is a real–space surface imaging method with atomic or subatomic resolution in all three dimensions which has been developed by 6. BINNIG and H. ROHRER. Besides imaging the surface topography, it also provides useful information on its electronic properties as well as spectroscopic images. The principle and operation modes of tunneling microscopy and spectroscopy will be described and illustrated by applications to Si surfaces and interfaces.

Keywords

Scan Tunneling Microscopy Electron Tunneling Spectroscopic Image Tunneling Spectroscopy Tunneling Condition 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© Springer-verlag Berlin Heidelberg 1987

Authors and Affiliations

  • F. Salvan
    • 1
    • 2
  1. 1.Laboratoire de Physique des Etats CondensésU.A. CNRS 783Marseille Cedex 9France
  2. 2.Faculté des Sciences de Luminy, Département de PhysiqueMarseille Cedex 9France

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