Digital Holography for Metrologic Applications

  • Thomas Kreis
Conference paper

DOI: 10.1007/978-3-642-57323-1_25

Cite this paper as:
Kreis T. (2000) Digital Holography for Metrologic Applications. In: Jacquot P., Fournier JM. (eds) Interferometry in Speckle Light. Springer, Berlin, Heidelberg

Abstract

In digital holography the holograms are recorded by CCD-arrays. The reconstruction of the complex wavefields is performed numerically in the computer. This enormously improves metrologic applications like deformation measurement, contour measurement, vibration analysis, refractive index determination, particle analysis, or microscopy.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2000

Authors and Affiliations

  • Thomas Kreis
    • 1
  1. 1.BIAS - Bremer Institut für angewandte StrahltechnikBremenGermany

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