Depth Estimation of an Absorbent Embedded in a Dense Medium Using Diffused Wave Reflectometry

Abstract

The purpose of this research is to propose a new and simple method in measuring the depth of an absorbent embedded in a dense scattering medium by using a diffused wave reflectometry. The estimation of the depth of the absorbent is based on the assumption that the total intensity over the backscattering plane equals to the probability that the intensity profile is formed by the contribution of the waves with the path-length shorter than a certain maximum path-length. To confirm the principle, the Monte Carlo simulations and experiments are repeated for the absorbents with various depths and shapes and the various positions of the beam incidence. Finally, we demonstrate the validity of the proposed principle and the possibility to apply the new method to the surface profiling of the absorbent, i.e. the diffused wave topography.