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Theory of Scanning Probe Microscopy

  • Naruo Sasaki
  • Masaru Tsukada
Part of the Advances in Materials Research book series (ADVSMATERIALS, volume 2)

Summary

The first-principles simulation method of STM images is introduced and applied to various surface systems. It is clarified how atomic resolution can be achieved by STM, and tip effects are discussed. For the case of scanning force microscopy, we have been able to reproduce FFM images of graphite fairly well by use of a simple tip model involving only a single atom. Cantilever dynamics for dynamic-mode AFM are carefully studied using numerical simulations and analysis of the equation of motion. The mechanisms of dynamic force microscopy are discussed in the light of these results.

Keywords

Scan Probe Microscopy Resonance Curve Hard Wall Scan Force Microscopy Hard Wall Model 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2000

Authors and Affiliations

  • Naruo Sasaki
  • Masaru Tsukada

There are no affiliations available

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