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Organic Materials for Optoelectronic Applications

  • Andreas FurchnerEmail author
  • Dennis Aulich
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 52)

Abstract

Material characterization in the wide field of optoelectronics often involves ellipsometric measurements. A deep knowledge of the sample properties, including anisotropy, is required for successful material analysis via optical modeling. This appendix provides thin-film optical constants n and k for commonly used organic materials used for transparent electrodes, solar cells, etc.

Keywords

Solar Cell Density Functional Theory Thin Solid Film American Chemical Society Optical Constant 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer-Verlag Berlin Heidelberg 2014

Authors and Affiliations

  1. 1.Forschungsbereich Material- und GrenzflächenanalytikLeibniz-Institut für Analytische Wissenschaften – ISAS – e.V.BerlinGermany

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