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Detection and Matching of Lines for Close-Range Photogrammetry

  • Juan López
  • María Fuciños
  • Xosé R. Fdez-Vidal
  • Xosé M. Pardo
Part of the Lecture Notes in Computer Science book series (LNCS, volume 7887)

Abstract

Photogrammetry is a flexible, accurate and non-contact measurement tool, which has been proven to be very profitable for many industrial applications. In order to achieve robustness and full automation of the measurement process, all commercial photogrammetric systems use physical retro-reflective markers. However, attaching markers to big structures is often impractical. Recently, big interest emerged concerning the use of natural markers, such as lines and conics, in industrial photogrammetric processes. In this paper we present a novel approach for line detection and matching aimed at achieving good performance with industrial images acquired under varying illumination conditions.

Keywords

Illumination Condition Illumination Change Synthetic Image Line Extraction Phase Congruency 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  • Juan López
    • 1
  • María Fuciños
    • 1
  • Xosé R. Fdez-Vidal
    • 1
  • Xosé M. Pardo
    • 1
  1. 1.Centro de Investigación en Tecnoloxías da Información (CITIUS)Universidade de Santiago de CompostelaSpain

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