Application of the Model to Carrier Profiling
Part of the Springer Theses book series (Springer Theses)
In this chapter, the insights of the previous chapters are put together in order to solve the inverse problem. In other words, in this chapter, we show how to deduce information about unknown active doping profiles based on TP measurements.
KeywordsDoping Concentration Layer Plasma Thermal Component Junction Depth Dope Layer
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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