The TEM and Its Optics

  • Brent Fultz
  • James Howe
Part of the Graduate Texts in Physics book series (GTP)

Abstract

This chapter is an introduction to the transmission electron microscope (TEM), using ray diagrams to discuss its essential optical design and its component subsystems. Bright- and dark-field imaging are explained, as is selected area diffraction, convergent beam diffraction, high-angle annular dark field imaging, and high-resolution transmission electron microscopy. Some practical issues of spectroscopy, diffraction, and imaging are discussed. Both glass lenses and magnetic lenses are described, and their focusing action is explained by ray tracing and by phase distortions of the wavefront. Brightness and other issues underlying image resolution are described, and limits of resolution are presented for different high-resolution methods.

Keywords

Optic Axis Focal Plane Objective Lens Select Area Diffraction Pattern Wave Crest 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  • Brent Fultz
    • 1
  • James Howe
    • 2
  1. 1.Dept. Applied Physics and Materials ScienceCalifornia Institute of TechnologyPasadenaUSA
  2. 2.Dept. Materials Science and EngineeringUniversity of VirginiaCharlottesvilleUSA

Personalised recommendations