Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy

Chapter
Part of the NanoScience and Technology book series (NANO)

Abstract

Atomic force acoustic microscopy (AFAM) is a contact-resonance spectroscopy technique originally designed to determine elastic properties at the nanometer scale. While the load dependent shift of contact-resonance frequencies has been exploited to determine the elasticity of sample surfaces, less attention has been given to the damping of contact resonances. In this chapter, the authors show how the atomic force microscopy technique can be used to measure interfacial and internal friction by analyzing the Q-factor of contact-resonance curves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  1. 1.INM – Leibniz-Institute for New MaterialsSaarbrückenGermany
  2. 2.WPI-Advanced Institute of Materials ResearchTohoku UniversitySendaiJapan
  3. 3.Department of MaterialsSaarland UniversitySaarbrückenGermany
  4. 4.Physikalisches InstitutUniversität GöttingenGöttingenGermany

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