Acoustic Scanning Probe Microscopy

Part of the series NanoScience and Technology pp 391-416


Friction and Internal Friction Measurements by Atomic Force Acoustic Microscopy

  • A. CaronAffiliated withINM – Leibniz-Institute for New Materials Email author 
  • , W. ArnoldAffiliated withWPI-Advanced Institute of Materials Research, Tohoku UniversityDepartment of Materials, Saarland University

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Atomic force acoustic microscopy (AFAM) is a contact-resonance spectroscopy technique originally designed to determine elastic properties at the nanometer scale. While the load dependent shift of contact-resonance frequencies has been exploited to determine the elasticity of sample surfaces, less attention has been given to the damping of contact resonances. In this chapter, the authors show how the atomic force microscopy technique can be used to measure interfacial and internal friction by analyzing the Q-factor of contact-resonance curves.