Uncovering Path Delay Faults with Multi-Objective EAs

  • Ernesto Sanchez
  • Giovanni Squillero
  • Alberto Tonda
Part of the Intelligent Systems Reference Library book series (ISRL, volume 34)

Abstract

This chapter presents an innovative approach for the generation of test programs detecting path-delay faults in microprocessors. The proposed method takes advantage of the multiobjective implementation of a previously devised evolutionary algorithm and exploits both gate- and RT-level descriptions of the processor: the former is used to build Binary Decision Diagrams (BDDs) for deriving fault excitation conditions; the latter is used for the automatic generation of test programs able to excite and propagate fault effects, based on a fast RTL simulation. Experiments on an 8-bit microcontroller show that the proposed method is able to generate suitable test programs more efficiently compared to existing approaches. Preliminary results have been published in [10].

Keywords

Clock Cycle Fault Injection Binary Decision Diagram Delay Fault Fault List 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2012

Authors and Affiliations

  • Ernesto Sanchez
    • Giovanni Squillero
      • Alberto Tonda

        There are no affiliations available

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