Optimizing Measured Signal Intensity: Emission Angle, Incidence Angle and Surface Roughness

Chapter
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 49)

Abstract

The primary aim of any analysis is a high signal intensity (count rate) that ensures a high signal to noise ratio and therefore a high sensitivity. While the ultimate limit is given by the properties of the respective instrument, its optimum settings can be chosen by the analyst within those limits. Besides primary excitation energy and power (current), the most important other parameters which can be varied and optimized by the analyst are set by the geometry between excitation source, sample, and analyzer. In any modern instrument, the sample can be tilted with respect to the analyzer axis. In this way, the angle of incidence of the primary photons or electrons and the angle of emission of Auger- or photoelectrons can be varied (Sects. 5.1 and 5.2). This variation cannot only be used to find optimum signal intensity but also to provide nondestructive depth profiles by angle-resolved XPS (AR-XPS) and AES (AR-AES) (see Sect. 7.2.1).

Keywords

Incidence Angle Tilt Angle Critical Angle Emission Angle Attenuation Length 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  1. 1.Max-Planck-Institute for Intelligent Systems (formerly Max-Planck-Institute for Metals Research)StuttgartGermany

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