An Experimental Test System for IMT-Advanced Communication Protocols

  • Sihai Zhang
  • Lingjuan Han
  • Linghong Yu
  • Wuyang Zhou
Chapter
Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 127)

Abstract

Increased complexity in IMT-Advanced communication technology brings significant challenge to correct implementation of communication protocols and protocol interaction. In this paper, we designed an experimental test system which aims to verify and test IMT-Advanced key technologies of MAC and RRC layer. The test system contains three parts, including Testing System (TS), Test Adapter (TA) and System under test (SUT). Compared with traditional TTCN-3 test framework a module called TA as a bridge connecting TS and SUT is adopted, which makes testing more simpler and flexible. The system can support both conformance testing and performance testing. A relay communication scenario is developed and the testing results show that the proposed test system is efficient and reliable.

Keywords

Test Adapter System Under Test Testing Logic Conformance Testing Prioritize Test Case 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag GmbH Berlin Heidelberg 2012

Authors and Affiliations

  • Sihai Zhang
    • 1
  • Lingjuan Han
    • 2
  • Linghong Yu
    • 3
  • Wuyang Zhou
    • 4
  1. 1.Wireless Information Network LaboratoryUniversity of Science and Technology of ChinaHefeiP.R. China
  2. 2.Department of Electronic EngineeringUniversity of Science and Technology of ChinaHefeiP.R. China
  3. 3.School of Information Science and TechnologyUniversity of Science and Technology of ChinaHefeiP.R. China
  4. 4.Key Laboratory of Wireless Sensor Network & Communication, Shanghai Institute of Microsystem and Information TechnologyChinese Academy of SciencesShanghaiP.R. China

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