Chip Level Statistical Leakage Power Estimation Using Generalized Extreme Value Distribution

  • Alireza Khosropour
  • Hossein Aghababa
  • Ali Afzali-Kusha
  • Behjat Forouzandeh
Part of the Lecture Notes in Computer Science book series (LNCS, volume 6951)

Abstract

Previous works for full-chip leakage power estimation are all based on Wilkinson’s approach which approximates sum of lognormal random variables as another lognormal by matching the first and second moments. In this paper we will show that natural logarithm of leakage deviates from normal distribution by scaling transistor sizes, as a result distribution of leakage power cannot be described by lognormal distribution anymore. We will introduce generalized extreme value distribution as the best candidate for full-chip leakage power estimation and we will prove its superiority over lognormal approximation through simulation results in 45nm technology.

Keywords

Monte Carlo Lognormal Distribution Generalize Extreme Value Generalize Extreme Value Distribution Leakage Power 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Alireza Khosropour
    • 1
  • Hossein Aghababa
    • 1
  • Ali Afzali-Kusha
    • 1
  • Behjat Forouzandeh
    • 1
  1. 1.Nanoelectronics Center of Excellence, School of Electrical and Computer EngineeringUniversity of TehranTehranIran

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