OSC 2010: Optical Supercomputing pp 119-130 | Cite as
Exceeding the Diffraction and the Geometric Limits of Imaging Systems: A Review
Conference paper
Abstract
In this review paper we explain the diffraction and the geometric related limits of an imaging system and discuss several practical techniques to overcome those limitations.
Keywords
Super resolution Diffraction limit Geometric limitPreview
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References
- 1.Abbe, E.: “Beitrage zur theorie des mikroskops und der mikroskopischen wahrnehmung. Arch. Mikrosk. Anat. 9, 413–468 (1873)CrossRefGoogle Scholar
- 2.Zalevsky, Z., Mendlovic, D.: Optical Super Resolution. Springer, New-York (2002)Google Scholar
- 3.Zalevsky, Z., Mendlovic, D., Lohmann, A.W.: Progress in Optics. In: Wolf, E. (ed.) Optical System with Improved Resolving Power, vol. XL, Elsevier, Amsterdam (1999)Google Scholar
- 4.Lohmann, A.W., Dorsch, R.G., Mendlovic, D., Zalevsky, Z., Ferreira, C.: About the space bandwidth product of optical signal and systems. J. Opt. Soc. Am. A 13, 470–473 (1996)CrossRefGoogle Scholar
- 5.Mendlovic, D., Lohmann, A.W.: Space-bandwidth product adaptation and its applications to superresolution: fundamentals. J. Opt. Soc. Am. A 14, 558–562 (1997)CrossRefGoogle Scholar
- 6.Mendlovic, D., Lohmann, A.W., Zalevsky, Z.: Space-badnwidth– product adaptation and its application for superresolution - examples. J. Opt. Soc. Am. A 14, 563–567 (1997)CrossRefGoogle Scholar
- 7.Francon, M.: Amelioration de resolution d’optique. Nuovo. Cimento. Suppl. 9, 283–290 (1952)CrossRefGoogle Scholar
- 8.Lukosz, W.: Optical systems with resolving powers exceeding the classical limits. J. Opt. Soc. Am. 56, 1463–1472 (1967)CrossRefGoogle Scholar
- 9.Mendlovic, D., Lohmann, A.W., Konforti, N., Kiryuschev, I., Zalevsky, Z.: One dimensional superresolution optical system for temporally restricted objects. Appl. Opt. 36, 2353–2359 (1997)CrossRefGoogle Scholar
- 10.Mendlovic, D., Kiryuschev, I., Zalevsky, Z., Lohmann, A.W., Farkas, D.: Two dimensional superresolution optical system for temporally restricted objects. Appl. Opt. 36, 6687–6691 (1997)CrossRefGoogle Scholar
- 11.Garcia, J., Zalevsky, Z., Fixler, D.: Synthetic aperture superresolution by speckle pattern projection. Opt. Exp. 13, 6073–6078 (2005)CrossRefGoogle Scholar
- 12.Fixler, D., Garcia, J., Zalevsky, Z., Weiss, A., Deutsch, M.: Speckle Random Coding for 2-D Super Resolving Fluorescent Microscopic Imaging. Micron. 38, 121–128 (2007)CrossRefGoogle Scholar
- 13.Shemer, A., Mendlovic, D., Zalevsky, Z., Garcia, J., Martinez, P.G.: Super resolving optical system with time multiplexing and computer decoding. Appl. Opt. 38, 7245–7251 (1999)CrossRefGoogle Scholar
- 14.Zalevsky, Z., Garcia, J., Ferreira, C.: Super Resolved Imaging of Remote Moving Targets. Opt. Let. 31, 586–588 (2006)CrossRefGoogle Scholar
- 15.Zalevsky, Z., Saat, E., Orbach, S., Mico, V., Garcia, J.: Exceeding the resolving imaging power using environmental conditions. Appl. Opt. 47, A1–A6 (2008)CrossRefGoogle Scholar
- 16.Gur, A., Fixler, D., Micó, V., Garcia, J., Zalevsky, Z.: Linear optics based nanoscopy. Opt. Exp. 18, 22222–22231 (2010)CrossRefGoogle Scholar
- 17.Zalevsky, Z., Garcia, J., Garcia-Martinez, P., Ferreira, C.: Spatial information transmission using orthogonal mutual coherence coding. Opt. Let. 20, 2837–2839 (2005)CrossRefGoogle Scholar
- 18.Mico, V., García, J., Ferreira, C., Sylman, D., Zalevsky, Z.: Spatial Information Transmission Using Axial Temporal Coherence Coding. Opt. Lett. 32, 736–738 (2007)CrossRefGoogle Scholar
- 19.Sylman, D., Zalevsky, Z., Mico, V., Garcia, J.: Super-Resolved or Field of View Enlarged Imaging based upon Spatial Depolarization of Light. Opt. Commun. 283, 1715–1719 (2010)CrossRefGoogle Scholar
- 20.Kartashev, A.I.: Optical systems with enhanced resolving power. Opt. Spectrosc. 9, 204–206 (1960)Google Scholar
- 21.Armitage, J.D., Lohmann, A.W., Parish, D.P.: “Superresolution image forming systems for objects with restricted lambda dependence. Jpn. J. Appl. Phys. 4, 273–275 (1965)Google Scholar
- 22.Alexandrov, S.A., Sampson, D.D.: “Spatial information transmission beyond a system’s diffraction limit using optical spectral encoding of the spatial frequency. J. Opt. A: Pure Appl. Opt. 10, 25304 (2008)CrossRefGoogle Scholar
- 23.Schwarz, A., Weiss, A., Fixler, D., Zalevsky, Z., Micó, V., García, J.: One-Dimensional Wavelength Multiplexed Microscope without Objective Lens. Opt. Commun. 282, 2780–2786 (2009)CrossRefGoogle Scholar
- 24.Gur, A., Aharoni, R., Zalevsky, Z., Garini, Y., Mico, V., Garcia, J.: Lensless Superresolved Microscopy based on Sub-Wavelength Non-Periodic Holes Array Plate, High and Super Resolution Imaging (SHRI) Conference in Lipica, Slovenia (September 2009)Google Scholar
- 25.Sauceda, A., Ojeda-Castaneda, J.: High focal depth with fractional-power wavefronts. Opt. Lett. 29, 560–562 (2004)CrossRefGoogle Scholar
- 26.Chi, W., George, N.: Electronic imaging using a logarithmic asphere. Opt. Lett. 26, 875–877 (2001)CrossRefGoogle Scholar
- 27.Dowski, E.R., Cathey, W.T.: Extended depth of field through wave-front coding. Appl. Opt. 34, 1859–1866 (1995)CrossRefGoogle Scholar
- 28.Ben-Eliezer, E., Zalevsky, Z., Marom, E., Konforti, N.: All-optical extended depth of field imaging system. J. Opt. A: Pure Appl. Opt. 5, S164–S169 (2003)CrossRefGoogle Scholar
- 29.Zalevsky, Z., Shemer, A., Zlotnik, A., Ben-Eliezer, E., Marom, E.: All-optical axial super resolving imaging using low-frequency binary-phase mask. Opt. Express 14, 2631–2643 (2006)CrossRefGoogle Scholar
- 30.Raveh, I., Zalevsky, Z.: All-optical axially multi-regional super resolved imaging. Opt. Express 15, 17912–17921 (2007)CrossRefGoogle Scholar
- 31.Zalevsky, Z., Ben Yaish, S., Yehezkel, O., Belkin, M.: Thin spectacles for myopia, presbyopia and astigmatism insensitive vision. Opt. Express 15, 10790–10803 (2007)CrossRefGoogle Scholar
- 32.Zlotnik, A., Ben Yaish, S., Yehezkel, O., Lahav-Yacouel, K., Belkin, M., Zalevsky, Z.: Extended Depth of Focus Contact Lenses for Presbyopia. Opt. Lett. 34, 2219–2221 (2009)CrossRefGoogle Scholar
- 33.Ben Yaish, S., Zlotnik, A., Raveh, I., Yehezkel, O., Belkin, M., Zalevsky, Z.: Intra-Ocular Omni-Focal Lens with Increased Tolerance to Decentration and Astigmatism. Journal of Refractive Surgery 26(1) (January 2010)Google Scholar
- 34.Fortin, J., Chevrette, P., Plante, R.: Evaluation of the microscanning process. In: Proc. SPIE, vol. 2269, pp. 271–279 (1994)Google Scholar
- 35.Borman, S., Stevenson, R.: Super-resolution from image sequences - A review. In: Proc. Midwest Symposium on Circuits and Systems, pp. 374–378 (1998)Google Scholar
- 36.Zalevsky, Z., Mendlovic, D., Marom, E.: Special sensor masking for exceeding system geometrical resolving power. Opt. Eng. 39, 1936–1942 (2000)CrossRefGoogle Scholar
- 37.Fixler, D., Garcia, J., Zalevsky, Z., Weiss, A., Deutsch, M.: Pattern projection for subpixel resolved imaging in microscopy. Micron. 38, 115–120 (2007)CrossRefGoogle Scholar
- 38.Borkowski, A., Zalevsky, Z., Javidi, B.: Geometrical super resolved imaging using non periodic spatial masking. J. Opt. Soc. Am. A 26, 589–601 (2009)CrossRefGoogle Scholar
- 39.Zalevsky, Z., Beiderman, Y., Margalit, I., Gingold, S., Teicher, M., Mico, V., Garcia, J.: Simultaneous remote extraction of multiple speech sources and heart beats from secondary speckles pattern. Opt. Express. 17, 21566–21580 (2009)CrossRefGoogle Scholar
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