OSC 2010: Optical Supercomputing pp 119-130 | Cite as

Exceeding the Diffraction and the Geometric Limits of Imaging Systems: A Review

  • Zeev Zalevsky
Part of the Lecture Notes in Computer Science book series (LNCS, volume 6748)

Abstract

In this review paper we explain the diffraction and the geometric related limits of an imaging system and discuss several practical techniques to overcome those limitations.

Keywords

Super resolution Diffraction limit Geometric limit 

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References

  1. 1.
    Abbe, E.: “Beitrage zur theorie des mikroskops und der mikroskopischen wahrnehmung. Arch. Mikrosk. Anat. 9, 413–468 (1873)CrossRefGoogle Scholar
  2. 2.
    Zalevsky, Z., Mendlovic, D.: Optical Super Resolution. Springer, New-York (2002)Google Scholar
  3. 3.
    Zalevsky, Z., Mendlovic, D., Lohmann, A.W.: Progress in Optics. In: Wolf, E. (ed.) Optical System with Improved Resolving Power, vol. XL, Elsevier, Amsterdam (1999)Google Scholar
  4. 4.
    Lohmann, A.W., Dorsch, R.G., Mendlovic, D., Zalevsky, Z., Ferreira, C.: About the space bandwidth product of optical signal and systems. J. Opt. Soc. Am. A 13, 470–473 (1996)CrossRefGoogle Scholar
  5. 5.
    Mendlovic, D., Lohmann, A.W.: Space-bandwidth product adaptation and its applications to superresolution: fundamentals. J. Opt. Soc. Am. A 14, 558–562 (1997)CrossRefGoogle Scholar
  6. 6.
    Mendlovic, D., Lohmann, A.W., Zalevsky, Z.: Space-badnwidth– product adaptation and its application for superresolution - examples. J. Opt. Soc. Am. A 14, 563–567 (1997)CrossRefGoogle Scholar
  7. 7.
    Francon, M.: Amelioration de resolution d’optique. Nuovo. Cimento. Suppl. 9, 283–290 (1952)CrossRefGoogle Scholar
  8. 8.
    Lukosz, W.: Optical systems with resolving powers exceeding the classical limits. J. Opt. Soc. Am. 56, 1463–1472 (1967)CrossRefGoogle Scholar
  9. 9.
    Mendlovic, D., Lohmann, A.W., Konforti, N., Kiryuschev, I., Zalevsky, Z.: One dimensional superresolution optical system for temporally restricted objects. Appl. Opt. 36, 2353–2359 (1997)CrossRefGoogle Scholar
  10. 10.
    Mendlovic, D., Kiryuschev, I., Zalevsky, Z., Lohmann, A.W., Farkas, D.: Two dimensional superresolution optical system for temporally restricted objects. Appl. Opt. 36, 6687–6691 (1997)CrossRefGoogle Scholar
  11. 11.
    Garcia, J., Zalevsky, Z., Fixler, D.: Synthetic aperture superresolution by speckle pattern projection. Opt. Exp. 13, 6073–6078 (2005)CrossRefGoogle Scholar
  12. 12.
    Fixler, D., Garcia, J., Zalevsky, Z., Weiss, A., Deutsch, M.: Speckle Random Coding for 2-D Super Resolving Fluorescent Microscopic Imaging. Micron. 38, 121–128 (2007)CrossRefGoogle Scholar
  13. 13.
    Shemer, A., Mendlovic, D., Zalevsky, Z., Garcia, J., Martinez, P.G.: Super resolving optical system with time multiplexing and computer decoding. Appl. Opt. 38, 7245–7251 (1999)CrossRefGoogle Scholar
  14. 14.
    Zalevsky, Z., Garcia, J., Ferreira, C.: Super Resolved Imaging of Remote Moving Targets. Opt. Let. 31, 586–588 (2006)CrossRefGoogle Scholar
  15. 15.
    Zalevsky, Z., Saat, E., Orbach, S., Mico, V., Garcia, J.: Exceeding the resolving imaging power using environmental conditions. Appl. Opt. 47, A1–A6 (2008)CrossRefGoogle Scholar
  16. 16.
    Gur, A., Fixler, D., Micó, V., Garcia, J., Zalevsky, Z.: Linear optics based nanoscopy. Opt. Exp. 18, 22222–22231 (2010)CrossRefGoogle Scholar
  17. 17.
    Zalevsky, Z., Garcia, J., Garcia-Martinez, P., Ferreira, C.: Spatial information transmission using orthogonal mutual coherence coding. Opt. Let. 20, 2837–2839 (2005)CrossRefGoogle Scholar
  18. 18.
    Mico, V., García, J., Ferreira, C., Sylman, D., Zalevsky, Z.: Spatial Information Transmission Using Axial Temporal Coherence Coding. Opt. Lett. 32, 736–738 (2007)CrossRefGoogle Scholar
  19. 19.
    Sylman, D., Zalevsky, Z., Mico, V., Garcia, J.: Super-Resolved or Field of View Enlarged Imaging based upon Spatial Depolarization of Light. Opt. Commun. 283, 1715–1719 (2010)CrossRefGoogle Scholar
  20. 20.
    Kartashev, A.I.: Optical systems with enhanced resolving power. Opt. Spectrosc. 9, 204–206 (1960)Google Scholar
  21. 21.
    Armitage, J.D., Lohmann, A.W., Parish, D.P.: “Superresolution image forming systems for objects with restricted lambda dependence. Jpn. J. Appl. Phys. 4, 273–275 (1965)Google Scholar
  22. 22.
    Alexandrov, S.A., Sampson, D.D.: “Spatial information transmission beyond a system’s diffraction limit using optical spectral encoding of the spatial frequency. J. Opt. A: Pure Appl. Opt. 10, 25304 (2008)CrossRefGoogle Scholar
  23. 23.
    Schwarz, A., Weiss, A., Fixler, D., Zalevsky, Z., Micó, V., García, J.: One-Dimensional Wavelength Multiplexed Microscope without Objective Lens. Opt. Commun. 282, 2780–2786 (2009)CrossRefGoogle Scholar
  24. 24.
    Gur, A., Aharoni, R., Zalevsky, Z., Garini, Y., Mico, V., Garcia, J.: Lensless Superresolved Microscopy based on Sub-Wavelength Non-Periodic Holes Array Plate, High and Super Resolution Imaging (SHRI) Conference in Lipica, Slovenia (September 2009)Google Scholar
  25. 25.
    Sauceda, A., Ojeda-Castaneda, J.: High focal depth with fractional-power wavefronts. Opt. Lett. 29, 560–562 (2004)CrossRefGoogle Scholar
  26. 26.
    Chi, W., George, N.: Electronic imaging using a logarithmic asphere. Opt. Lett. 26, 875–877 (2001)CrossRefGoogle Scholar
  27. 27.
    Dowski, E.R., Cathey, W.T.: Extended depth of field through wave-front coding. Appl. Opt. 34, 1859–1866 (1995)CrossRefGoogle Scholar
  28. 28.
    Ben-Eliezer, E., Zalevsky, Z., Marom, E., Konforti, N.: All-optical extended depth of field imaging system. J. Opt. A: Pure Appl. Opt. 5, S164–S169 (2003)CrossRefGoogle Scholar
  29. 29.
    Zalevsky, Z., Shemer, A., Zlotnik, A., Ben-Eliezer, E., Marom, E.: All-optical axial super resolving imaging using low-frequency binary-phase mask. Opt. Express 14, 2631–2643 (2006)CrossRefGoogle Scholar
  30. 30.
    Raveh, I., Zalevsky, Z.: All-optical axially multi-regional super resolved imaging. Opt. Express 15, 17912–17921 (2007)CrossRefGoogle Scholar
  31. 31.
    Zalevsky, Z., Ben Yaish, S., Yehezkel, O., Belkin, M.: Thin spectacles for myopia, presbyopia and astigmatism insensitive vision. Opt. Express 15, 10790–10803 (2007)CrossRefGoogle Scholar
  32. 32.
    Zlotnik, A., Ben Yaish, S., Yehezkel, O., Lahav-Yacouel, K., Belkin, M., Zalevsky, Z.: Extended Depth of Focus Contact Lenses for Presbyopia. Opt. Lett. 34, 2219–2221 (2009)CrossRefGoogle Scholar
  33. 33.
    Ben Yaish, S., Zlotnik, A., Raveh, I., Yehezkel, O., Belkin, M., Zalevsky, Z.: Intra-Ocular Omni-Focal Lens with Increased Tolerance to Decentration and Astigmatism. Journal of Refractive Surgery 26(1) (January 2010)Google Scholar
  34. 34.
    Fortin, J., Chevrette, P., Plante, R.: Evaluation of the microscanning process. In: Proc. SPIE, vol. 2269, pp. 271–279 (1994)Google Scholar
  35. 35.
    Borman, S., Stevenson, R.: Super-resolution from image sequences - A review. In: Proc. Midwest Symposium on Circuits and Systems, pp. 374–378 (1998)Google Scholar
  36. 36.
    Zalevsky, Z., Mendlovic, D., Marom, E.: Special sensor masking for exceeding system geometrical resolving power. Opt. Eng. 39, 1936–1942 (2000)CrossRefGoogle Scholar
  37. 37.
    Fixler, D., Garcia, J., Zalevsky, Z., Weiss, A., Deutsch, M.: Pattern projection for subpixel resolved imaging in microscopy. Micron. 38, 115–120 (2007)CrossRefGoogle Scholar
  38. 38.
    Borkowski, A., Zalevsky, Z., Javidi, B.: Geometrical super resolved imaging using non periodic spatial masking. J. Opt. Soc. Am. A 26, 589–601 (2009)CrossRefGoogle Scholar
  39. 39.
    Zalevsky, Z., Beiderman, Y., Margalit, I., Gingold, S., Teicher, M., Mico, V., Garcia, J.: Simultaneous remote extraction of multiple speech sources and heart beats from secondary speckles pattern. Opt. Express. 17, 21566–21580 (2009)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Zeev Zalevsky
    • 1
  1. 1.School of EngineeringBar-Ilan UniversityRamat-GanIsrael

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