A Model of Saliency-Based Selective Attention for Machine Vision Inspection Application

  • Xiao-Feng Ding
  • Li-Zhong Xu
  • Xue-Wu Zhang
  • Fang Gong
  • Ai-Ye Shi
  • Hui-Bin Wang
Part of the Lecture Notes in Computer Science book series (LNCS, volume 6594)

Abstract

A machine vision inspection model of surface defects, inspired by the methodologies of neuroanatomy and psychology, is investigated. Firstly, the features extracted from defect images are combined into a saliency map. The bottom-up attention mechanism then obtains ‘‘what’’ and ‘‘where’’ information. Finally, the Markov model is used to classify the types of the defects. Experimental results demonstrate the feasibility and effectiveness of the proposed model with 94.40% probability of accurately detecting of the existence of cropper strips defects.

Keywords

Vision inspection Surface defect Saliency map Selective attention Markov model 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Zheng, H., Kong, L., Nahavandi, S.: Automatic Inspection of Metallic Surface Defects using Genetic Algorithms. Journal of Materials Processing Tech. 125, 427–433 (2002)CrossRefGoogle Scholar
  2. 2.
    Liang, R., Ding, Y., Zhang, X., Chen, J.: Copper Strip Surface Defects Inspection Based on SVM-RBF. In: 4th International Conference on Natural Computation, pp. 41–45. IEEE Press, New York (2008)Google Scholar
  3. 3.
    Zhong, K.-H., Ding, M.-Y., Zhou, C.-P.: Texture Defect Inspection Method using Difference Statistics Feature in Wavelet Domain. Systems Engineering and Electronics 26, 660–665 (2004)Google Scholar
  4. 4.
    Zhang, X., Liang, R., Ding, Y., Chen, J., Duan, D., Zong, G.: The System of Copper Strips Surface Defects Inspection Based on Intelligent Fusion. In: 2008 IEEE International Conference on Automation and Logistics, pp. 476–480. IEEE Press, New York (2008)CrossRefGoogle Scholar
  5. 5.
    Li, T.-S.: Applying Wavelets Transform, Rough Set Theory and Support Vector Machine for Copper Clad Laminate Defects Classification. Expert Systems with Applications 36, 5822–5829 (2009)CrossRefGoogle Scholar
  6. 6.
    Luo, S.-W.: Information Processing Theory of Visual Perception. publishing house of electronics industry, Beijing (2006)Google Scholar
  7. 7.
    Noton, D., Stark, L.: Eye Movements and Visual Perception. Scientific American 224, 35–43 (1971)Google Scholar
  8. 8.
    Didday, R., Arbib, M.: Eye Movements and Visual Perception: A Two Visual System Model. International Journal of Man-Machine Studies 7, 547–570 (1975)CrossRefMATHGoogle Scholar
  9. 9.
    Itti, L., Koch, C., Niebur, E.: A Model of Saliency-based Visual Attention for Rapid Scene Analysis. IEEE Transactions on Pattern Analysis and Machine Intelligence 20, 1254–1259 (1998)CrossRefGoogle Scholar
  10. 10.
    Rimey, R., Brown, C.: Selective Attention as Sequential Behavior: Modeling Eye Movements with An Augmented Hidden Markov Model. Department of Computer Science, University of Rochester (1990)Google Scholar
  11. 11.
    Salah, A., Alpaydin, E., Akarun, L.: A Selective Attention-based Method for Visual Pattern Recognition with Application to Handwritten Digit Recognition and Face Recognition. IEEE Transactions on Pattern Analysis and Machine Intelligence 24, 420–425 (2002)CrossRefGoogle Scholar
  12. 12.
    Corbetta, M.: Frontoparietal Cortical Networks for Directing Attention and The Eye to Visual locations: Identical, independent, or overlapping neural systems? Proc. Natl. Acad. Sci. USA 95, 831–838 (1998)CrossRefGoogle Scholar
  13. 13.
    Vazquez, E., Gevers, T., Lucassen, M., Weijer, J., Baldrich, R.: Saliency of Color Image Derivatives: A Comparison between Computational Models and Human Perception. J. Opt. Soc. Am. A 27, 613–621 (2010)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Xiao-Feng Ding
    • 1
  • Li-Zhong Xu
    • 1
    • 2
  • Xue-Wu Zhang
    • 1
  • Fang Gong
    • 1
  • Ai-Ye Shi
    • 1
    • 2
  • Hui-Bin Wang
    • 1
    • 2
  1. 1.College of Computer and Information EngneeringHohai UniversityNanjingChina
  2. 2.Institute of Communication and Information System EngineeringHohai UniversityNanjingChina

Personalised recommendations