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Curved Reflection Symmetry Detection with Self-validation

  • Jingchen Liu
  • Yanxi Liu
Part of the Lecture Notes in Computer Science book series (LNCS, volume 6495)

Abstract

We propose a novel, self-validating approach for detecting curved reflection symmetry patterns from real, unsegmented images. Our method benefits from the observation that any curved symmetry pattern can be approximated by a sequence of piecewise rigid reflection patterns. Pairs of symmetric feature points are first detected (including both inliers and outliers) and treated as ‘particles’. Multiple-hypothesis sampling and pruning are used to sample a smooth path going through inlier particles to recover the curved reflection axis. Our approach generates an explicit supporting region of the curved reflection symmetry, which is further used for intermediate self-validation, making the detection process more robust than prior state-of-the-art algorithms. Experimental results on 200+ images demonstrate the effectiveness and superiority of the proposed approach.

Keywords

Feature Point Supporting Region Normalize Cross Correlation Smooth Path Symmetry Detection 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Jingchen Liu
    • 1
  • Yanxi Liu
    • 1
    • 2
  1. 1.Department of Computer Science and EngineeringThe Pennsylvania State UniversityUniversity ParkUSA
  2. 2.Department of Electrical EngineeringThe Pennsylvania State UniversityUniversity ParkUSA

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