Flatness Characterization: Two Approaches

  • Felix Antritter
  • Jean Lévine

Abstract

We survey two approaches to flatness necessary and sufficient conditions and compare them on examples.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2010

Authors and Affiliations

  • Felix Antritter
    • 1
  • Jean Lévine
    • 2
  1. 1.Automatisierungs- und RegelungstechnikUniversität der Bundeswehr MünchenNeubibergGermany
  2. 2.Mines ParisTechCAS- Centre Automatique et SystèmesFontainebleauFrance

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