Combining Scanning Probe Microscopy and Transmission Electron Microscopy

  • Alexandra Nafari
  • Johan Angenete
  • Krister Svensson
  • Anke Sanz-Velasco
  • Håkan Olin
Part of the NanoScience and Technology book series (NANO)


This chapter is a review of an in situ method where a scanning probe microscope (SPM) has been combined with a transmission electron microscope (TEM). By inserting a miniaturized SPM inside a TEM, a large set of open problems can be addressed and, perhaps more importantly, one may start to think about experiments in a new kind of laboratory, an in situ TEM probing laboratory, where the TEM is transformed from a microscope for still images to a real-time local probing tool. In this method, called TEMSPM, the TEM is used for imaging and analysis of a sample and SPM tip, while the SPM is used for probing of electrical and mechanical properties or for local manipulation of the sample. This chapter covers both instrumental and applicational aspects of TEMSPM.


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Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Alexandra Nafari
    • 1
  • Johan Angenete
    • 1
  • Krister Svensson
    • 2
  • Anke Sanz-Velasco
    • 3
  • Håkan Olin
    • 4
  1. 1.Nanofactory InstrumentsGothenburgSweden
  2. 2.Karlstad UniversityKarlstadSweden
  3. 3.Chalmers University of TechnologyGothenburgSweden
  4. 4.Mid Sweden UniversitySundsvallSweden

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