OpenMP Support for NBTI-Induced Aging Tolerance in MPSoCs

  • Andrea Marongiu
  • Andrea Acquaviva
  • Luca Benini
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 5873)

Abstract

Aging effect in next-generation technologies will play a major role in determining system reliability. In particular, wear-out impact due to Negative Bias Temperature Instability (NBTI) will cause an increase in circuit delays of up to 10% in three years [8]. In these systems, NBTI-induced aging can be slowed-down by inserting periods of recovery where the core is functionally idle and gate input is forced to a specific state. This effect can be exploited to impose a given common target lifetime for all the cores. In this paper we present a technique that allows core-wear-out dependent insertion of recovery periods during loop execution in MPSoCs. Performance loss is compensated based on the knowledge of recovery periods. Loop iterations are re-distributed so that cores with longer recovery are allocated less iterations.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2009

Authors and Affiliations

  • Andrea Marongiu
    • 1
  • Andrea Acquaviva
    • 2
  • Luca Benini
    • 1
  1. 1.DEISUniversity of BolognaBolognaItaly
  2. 2.DAUINPolitecnico di TorinoTorinoItaly

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