Spectroscopy with Atoms and Ions

Chapter

Abstract

Scattering of atoms and ions from solid surfaces is a good example for the development of an excentric experiment into a very useful and important technique for material analysis. These types of experiments are the youngest in the family of spectroscopy with particles. Also, the masses of the particles used as a probe are up to two orders of magnitude larger than those for the heavy particles discussed so far. Since the penetration of the atoms and ions into the solid material is very small very thin films or surfaces can be investigated. Hence the booming activities in surface science has naturally contributed to the development and to applications of this analytical technique.

Keywords

Rutherford Backscatter Spectroscopy Target Atom Rutherford Backscattering High Energy Particle Elastic Recoil Detection 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Copyright information

© Springer-Verlag Berlin Heidelberg 2009

Authors and Affiliations

  1. 1.Universität Wien Inst. MaterialphysikWienAustria

Personalised recommendations