TEM sample preparation of YBCO-coated conductors: conventional method and FIB

Abstract

YBa₂Cu₃O_7-δ (YBCO)-coated conductors prepared by the chemical solution deposition process (CSD) are currently of great interest for industrial applications. A flexible nickel tungsten substrate is dip-coated in a buffer layer and a YBCO precursor solution. The resulting thin films systems have a high misfit. TEM sample preparation is challenging and is a fundamental issue for the characterization of YBCO-coated conductors.