A new method for electron diffraction based analysis of phase fractions and texture in thin films of metallic nano-crystals

  • J. L. Lábár
  • P. B. Barna
  • O. Geszti
  • R. Grasin
  • G. Lestyán
  • F. Misják
  • G. Radnóczi
  • G. Sáfrán
  • L. Székely
Conference paper

Abstract

X-ray diffraction (XRD) based determination of phase fractions from powder samples has been common since the introduction of the Rietveld-method. Similar method did not exist for electron diffraction (ED), mainly due to the dynamic nature of ED. The last decade saw a boom in nano-technology and most of the transmission electron microscopy (TEM) laboratories frequently deal with nanocrystalline thin films. For these samples the kinematical approximation is acceptable.

Keywords

nano-crystalline quantitative analysis phase fractions texture SAED TEM 
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References

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Copyright information

© Springer-Verlag Berlin Heidelberg 2008

Authors and Affiliations

  • J. L. Lábár
    • 1
  • P. B. Barna
    • 1
  • O. Geszti
    • 1
  • R. Grasin
    • 1
  • G. Lestyán
    • 1
  • F. Misják
    • 1
  • G. Radnóczi
    • 1
  • G. Sáfrán
    • 1
  • L. Székely
    • 1
  1. 1.Research Institute for Technical Physics and Material ScienceBudapestHungary

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