Hot-Wall Epitaxial Growth of Films of Conjugated Molecules
Research on conjugated organic systems is a rapidly expanding field at the turn of chemistry, condensed matter physics, materials science, and device physics due to the promising opportunities for applications of these π-electron semiconductors in electronics and photonics. Due to their interdisciplinarity, this class of materials attracted the attention of a large number of researchers and triggered the beginning of a “revolution” in organic electronics. Originating with an initial focus on the p- and n-doping of conjugated oligomers and polymers, the unique electrochemical behavior of these technological important materials enabled the development of cheap sensors. Because of the progress toward better developed materials with higher order and purity, these organic materials are now also available for organic electronic devices. More generally, organic electronics includes now diodes, photodiodes, photovoltaic cells, light-emitting diodes, lasers, field-effect transistors, electrooptical couplers, and all organic integrated circuits, and claims thereupon for key technology of the twenty-first century [1].
Keywords
Atomic Force Microscopy Atomic Force Microscopy Image Atomic Force Microscopy Investigation Linear Defect Thermal Desorption SpectroscopyPreview
Unable to display preview. Download preview PDF.
References
- 1.A. Heeger, Curr. Appl. Phys. 1, 247 (2001)CrossRefADSGoogle Scholar
- 2.M. Granström, M. Harrison, R. Friend, Handbook of Oligo- and Polythiophenes (Wiley-VCH, Weinheim, 1999), p. 405 ffGoogle Scholar
- 3.A. Andreev, G. Matt, C. Brabec, H. Sitter, D. Badt, H. Seyringer, N. Sariciftci, Adv. Mater. 12, 629 (2000)CrossRefGoogle Scholar
- 4.J. Humenberger, K. Gresslehner, W. Schirz, H. Sitter, K. Lischka, MRS Proc. 216, 53 (1991)Google Scholar
- 5.J. Humenberger, H. Sitter, Thin Solid Films 163, 241 (1988)CrossRefADSGoogle Scholar
- 6.A. Lopez-Otero, Thin Solid Films 49, 3 (1978)CrossRefADSGoogle Scholar
- 7.J. Humenberger, H. Sitter, Thin Solid Films 163, 679 (1989)Google Scholar
- 8.V. Holy, J. Kubena, E. Abramof, K. Lischka, A. Pesek, E. Koppensteiner, J. Appl. Phys. 74, 1736 (1993)CrossRefADSGoogle Scholar
- 9.D. Stifter, H. Sitter, Fullerene Sci. Technol. 4, 277 (1996)Google Scholar
- 10.D. Stifter, H. Sitter, J. Cryst. Growth 156, 79 (1995)CrossRefADSGoogle Scholar
- 11.D. Stifter, H. Sitter, Thin Solid Films 280, 83 (1996)CrossRefADSGoogle Scholar
- 12.M. Krivoglaz, X-Ray and Neutron Diffraction in Nonideal Crystals (Springer, Berlin Heidelberg New York, 1996)Google Scholar
- 13.H. Sitter, D. Stifter, T. Nguyen Manh, Thin Solid Films 306, 313 (1997)CrossRefADSGoogle Scholar
- 14.H. Sitter, T. Nguyen Manh, Cryst. Res. Technol. 34, 605 (1999)CrossRefGoogle Scholar
- 15.A. Oshiyama, S. Saito, N. Hamada, Y. Miyamoto, J. Phys. Chem. Solids 53, 1457 (1992)CrossRefADSGoogle Scholar
- 16.H. Sitter, A. Andreev, G. Matt, N. Sariciftci, Mol. Cryst. Liq. Cryst. 385, 51 (2002)CrossRefGoogle Scholar
- 17.H. Sitter, A. Andreev, G. Matt, N. Sariciftci, Synth. Met. 138, 9 (2003)CrossRefGoogle Scholar
- 18.K. Baker, A. Fratini, T. Resch, H. Knachel, W. Adams, E. Socci, B. Farmer, Polymer 34, 1571 (1993)CrossRefGoogle Scholar
- 19.R. Resel, G. Leising, Surf. Sci. 409, 302 (1998)CrossRefADSGoogle Scholar
- 20.K. Erlacher, R. Resel, J. Keckes, F. Meghdadi, G. Leising, J. Cryst. Growth 206, 135 (1999)CrossRefADSGoogle Scholar
- 21.K. Erlacher, R. Resel, S. Hampel, T. Kuhlmann, K. Lischka, B. Müller, A. Thierry, B. Lotz, G. Leising, Surf. Sci. 437, 191 (1999)CrossRefADSGoogle Scholar
- 22.H. Yanagi, T. Morikawa, Appl. Phys. Lett. 75, 187 (1999)CrossRefADSGoogle Scholar
- 23.T. Mikami, H. Yanagi, Appl. Phys. Lett. 73, 563 (1998)CrossRefADSGoogle Scholar
- 24.A. Andreev, T. Haber, D.M. Smilgies, R. Resel, H. Sitter, N. Sariciftc, L. Valek, J. Cryst. Growth 275, e2037 (2005)CrossRefADSGoogle Scholar
- 25.H. Yanagi, T. Ohara, T. Morikawa, Adv. Mater. 13, 1452 (2001)CrossRefGoogle Scholar
- 26.T. Haber, A. Andreev, A. Thierry, H. Sitter, M. Oehzelt, R. Resel, J. Cryst. Growth 284, 209 (2005)CrossRefADSGoogle Scholar
- 27.T. Haber, M. Oehzelt, R. Resel, A. Andreev, A. Thierry, H. Sitter, D.M. Smilgies, B. Schaffer, W. Grogger, R. Resel, J. Nanosci. Nanotechnol. 6, 698 (2006)PubMedCrossRefGoogle Scholar
- 28.H. Yanagi, T. Morikawa, S. Hotta, K. Yase, Adv. Mater. 13, 313 (2001)CrossRefGoogle Scholar
- 29.D. Smilgies, N. Boudet, H. Yanagi, Appl. Surf. Sci. 189, 24 (2002)CrossRefADSGoogle Scholar
- 30.H. Plank, R. Resel, S. Purger, J. Keckes, A. Thierry, B. Lotz, A. Andreev, N. Sariciftci, H. Sitter, Phys. Rev. B 64, 235423 (2001)CrossRefADSGoogle Scholar
- 31.S. Müllegger, O. Stranik, E. Zojer, A. Winkler, Appl. Surf. Sci. 221, 184 (2004)CrossRefADSGoogle Scholar
- 32.H. Sitter, G. Matt, A. Andreev, C. Brabec, D. Badt, H. Neugebauer, N. Sariciftci, MRS Proc. 598, BB3.39 (2000)Google Scholar
- 33.H. Plank, R. Resel, A. Andreev, N. Sariciftci, H. Sitter, J. Cryst. Growth 237–239, 2076 (2002)CrossRefGoogle Scholar
- 34.A. Andreev, H. Sitter, C. Brabec, P. Hinterdorfer, G. Springholz, N. Sariciftci, Synth. Met. 121, 1379 (2001)CrossRefGoogle Scholar
- 35.A. Andreev, C. Teichert, G. Hlawacek, H. Hope, R. Resel, D.M. Smilgies, H. Sitter, N. Sariciftci, Org. Electron. 5, 23 (2004)CrossRefGoogle Scholar
- 36.C. Teichert, G. Hlawacek, A. Andreev, H. Sitter, P. Frank, A. Winkler, N. Sariciftci, Appl. Phys. A 82, 665 (2006)CrossRefADSGoogle Scholar
- 37.C. Teichert, Phys. Rep. 365, 335 (2002)CrossRefADSGoogle Scholar
- 38.H. Plank, R. Resel, H. Sitter, A. Andreev, N. Sariciftci, G. Hlawacek, C. Teichert, A. Thierry, B. Lotz, Thin Solid Films 443, 108 (2003)CrossRefADSGoogle Scholar