Piezoelectricity pp 181-198 | Cite as
Electromechanical Frequency Filters
Chapter
Frequency filters select signals with a frequency inside a definite frequency range or band from signals outside this band, traditionally afforded by a combination of L-C-resonators. The fundamental principle of all modern frequency filters is the constructive interference of travelling waves. If a filter is set up of coupled resonators, this interference occurs as a result of the successive wave reflection at the resonators’ ends. In this case, the center frequency f c of a filter, e.g., set up of symmetrical λ/2-resonators of length 1, is given by , where v ph is the phase velocity of the wave. This clearly shows the big advantage of acoustic waves for filter applications in comparison to electro-magnetic waves. Because v ph of acoustic waves in solids is about 104–105 smaller than that of electro-magnetic waves, much smaller filters can be realised. Today, piezoelectric materials and processing technologies exist that electromechanical resonators and filters can be produced in the frequency range from 1 kHz up to 10 GHz. Further requirements for frequency filters such as low losses (high resonator Q) and low temperature coefficients of frequency constants can also be fulfilled with these filters. Important examples are quartz-crystal resonators and filters (1 kHz–200 MHz) as discussed in Chap. 2, electromechanical channel filters (50 kHz and 130 kHz) for long-haul communication systems as discussed in this section, surface acoustic wave (SAW) filters (20 MHz–5 GHz), as discussed in Chap. 14, and thin film bulk acoustic resonators (FBAR) and filters (500 MHz–10 GHz), as discussed in Chap. 15.
$$f_c = f_r = v_{ph}/\lambda = v_{ph}/2l$$
Keywords
Surface Acoustic Wave Coupling Factor Piezoelectric Ceramic Frequency Constant Morphotropic Phase Boundary
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References
- 1.H. Albert, Feinwerktechnik 72, 244 (1968)Google Scholar
- 2.A.E. Günther, H. Albsmeier, K. Traub, Proc. IEEE 67, 102 (1979)CrossRefGoogle Scholar
- 3.W. Wersing, Ferroelectrics 22, 813 (1978)Google Scholar
- 4.H. Banno, T. Tsunooka, Jpn. J. Appl. Phys. 6, 954 (1967)CrossRefADSGoogle Scholar
- 5.R. Truell, C. Elbaum, B.B. Chick, Ultrasonic methods in Solid State Physics (Academic Press, New York, 1969) pp. 341–343Google Scholar
- 6.K. Carl, K.H. Härdtl, Ferroelectrics 17, 473 (1978)Google Scholar
- 7.H. Schichl, NTZ 4, 299 (1976)Google Scholar
- 8.M. Takahashi, N. Tsubouchi, M. Yonezawa, T. Ohno, T. Akashi, Nec Res. Develop. Jpn. 35, 57 (1974)Google Scholar
- 9.W. Wersing, Ferroelectrics 37, 611 (1981)Google Scholar
- 10.I.M. Lifschitz, L.N. Rosenzweig, J. Exp. Theoret. Phys. 16, 967 (1946)Google Scholar
- 11.G. Zorn, W. Wersing, H. Göbel, Jpn. J. Appl. Phys. 24 suppl. 24–2, 721 (1985)Google Scholar
- 12.J.O. Genter, P. Gerthsen, N.A. Schmidt, R.E. Send, J. Appl. Phys. 49, 4485 (1978)CrossRefADSGoogle Scholar
- 13.H.-J. Hagemann, J. Phys. C. Solid State Phys. 11, 3333 (1978)CrossRefADSGoogle Scholar
- 14.K.H. Härdtl, Ferroelectrics 24, 75 (1980)CrossRefGoogle Scholar
- 15.K. Möhring, H. Schichl, Ber. Deutsch. Keram. Ges. 53, 200 (1976)Google Scholar
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