Optics in Biomedical Sciences pp 15-20 | Cite as
Electron Microscopy in Medicine and Biology: Applications
Conference paper
Abstract
Electron microscopy has developed into a standard research method in medicine and biology. Because of the possibilities to represent structures in the range of macromolecular dimensions it is used in routine diagnostic work and pathology as well as high-resolution structure research [49]. Today electron microscopy has a permanent place in diagnostics and biopsies of the liver, kidney, muscle, nerves, intestine, in hygiene and virology, and particularly in molecular biology.
Keywords
Radiation Damage Chromatic Aberration Optical Diffraction Inverse Filter Coherent Optical Image
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References
- 1.U. Aebi, P.R. Smith: In Signal Processing, ed. by M. Kunt, F. de Coulon ( North Holland, Amsterdam 1980 ) pp. 219–228Google Scholar
- 2.A.W. Agar, R.H. Alderson, D. Chescoe: In Practical Methods in Electron Microscopy, Vol.2, ed. by M. Glauert ( North Holland, Amsterdam 1974 ) pp. 143–296Google Scholar
- 3.See Ref.2, p.87Google Scholar
- 4.N. Baba, K. Murata, K. Okada, Y. Fujimoto: Optik 58, 233–239 (1981)Google Scholar
- 5.S. Boseck, R. Hilgendorf, G. Hoffmann, J. Schmidt, A. Wasiljeff: Bedo 10, 707–712 (1977)Google Scholar
- 6.J.A. Chandler: In Practical Methods in Electron Microscopy, Vol.5 (II), ed. by M. Glauert ( North Holland, Amsterdam 1977 ) pp. 327–518Google Scholar
- 7.R.A. Crowther, D.J. De Rosier, A. Klug: Proc. R. Soc. Lond. A317, 319–340 (1970)ADSCrossRefGoogle Scholar
- 8.H.-G. Fehn, H. Hartwig, J. Kirchmeier, A. Wasiljeff, S. Boseck: Biotechnische Umschau 3, 354–358 (1979)Google Scholar
- 9.J. Frank: In Advanced Techniques in Biological Electron Microscopy, ed. by J.K. Koehler ( Springer, Berlin, Heidelberg, New York 1979 )Google Scholar
- 10.J. Frank, W. Goldfarb, D. Eisenberg, T.S. Baker: Ultramicroscopy 3, 283–290 (1978)CrossRefGoogle Scholar
- 11.J. Frank, W. Goldfarb, M. Kessel: Proc. 9th Int. Congr. Electron Microscopy, Toronto 1978Google Scholar
- 12.J. Frank, B. Shimkim: Proc. 9th Int. Congr. Electron Microscopy, Toronto 1978, Vol. 1, pp. 210–211Google Scholar
- 13.B.R. Frieden: J. Opt. Soc. Am. 62, 511–518 (1972)ADSCrossRefGoogle Scholar
- 14.J. Frosien, H.-M. Thieringer: Siemens Analysentechnische Mitteilungen 187Google Scholar
- 15.A.M. Glauert, N. Reid (eds.): Practical Methods in Electron Microscopy, Vol. 3 ( North Holland, Amsterdam 1974 )Google Scholar
- 16.W. Goldfarb, J. Frank: Proc. 9th Int. Congr. Electron Microscopy, Toronto 1978, Vol. 2, pp. 22–23Google Scholar
- 17.K.-J. Hangen: PTB Bericht, Braunschweig (1977)Google Scholar
- 18.K.-J. Hangen, R. Lauer, G. Ade: PTB Bericht Aph-15, Braunschweig (1980)Google Scholar
- 19.P.W. Hawkes (ed.): Computer Processing of Electron Microscope, Topics in Current Physics, Vo1.13 (Springer, Berlin, Heidelberg, New York 1980)Google Scholar
- 20.R. Hegerl, W. Hoppe: Z. Naturforsch. 31a, 1717–1721 (1976)Google Scholar
- 21.R. Henderson, P.N.T. Unwin: Nature 257, 28 (1975)ADSCrossRefGoogle Scholar
- 22.K.-H. Herrmann, D. Krahl, V. Rindfleisch: Siemens Forsch. Entwickl. Ber. 1 (1972)Google Scholar
- 23.K.-H. Herrmann, E. Reuber, P. Schiske: Proc. 9th Int. Congr. on Electron Microscopy, Toronto 1978, Vol. 1, pp. 226–227Google Scholar
- 24.W. Hoppe: Proc. R. Soc. London B261, 71–94 (1971)Google Scholar
- 25.W. Hoppe: Annal. N.Y. Acad. Sci. 306, 121–144 (1978)ADSCrossRefGoogle Scholar
- 26.W. Hoppe, B. Grill: Ultramicroscopy 2, 153–168 (1977)CrossRefGoogle Scholar
- 27.W. Hoppe, R. Mason (eds.): Unconventional Electron Microscopy for Molecular Structure Determination ( Vieweg, Braunschweig 1978 )Google Scholar
- 28.W. Hoppe, H.J. Schramm, M. Sturm, N. Hunsmann, J. Gaßmann: Z. Naturforsch. 31a, 1370–1379, 1380–1390 (1976)Google Scholar
- 29.W. Hoppe, H. Wenzl, H.J. Schramm: Hoppe-Seyler’s Z. Physiol. Chem. 358, 1069–1076Google Scholar
- 30.R.W. Horne, R. Markham: In Practical Methods in Electron Microscopy.Google Scholar
- 31.E. Knapek: Dissertation, Technische Universität Berlin (1981)Google Scholar
- 32.V. Knauer, H.J. Schramm, W. Hoppe: Proc. 9th Int. Congr. Electron Microscopy, Toronto 1978, Vol. 2, pp. 4–5Google Scholar
- 33.T. Kobayashi, L. Reimer: Optik 43, 237–248 (1975)Google Scholar
- 34.O. Kübler: Bildqualitätsanalyse in der Elektronenmikroskopie; Lehrgang 4493/46.22 der Tech. Akad. Esslingen (1980)Google Scholar
- 35.O. Kübler, M. Hahn, J. Seredynski: Optik 51, 171–188 (1978); 3, 235–256 (1978)Google Scholar
- 36.D. Kuschek: Material-und Strukturanalyse (Kontron) 10, 29–35 (1981)Google Scholar
- 37.R.H. Lange, H.P. Richter: J. Mol. Biol. 148, 487–491 (1981)CrossRefGoogle Scholar
- 38.K.R. Leonard, A.K. Kleinschmidt, N. Agabian-Keshishian, L. Shapiro, J.V. Maizel, Jr.: J. Mol. Biol. 71, 201–216 (1972)CrossRefGoogle Scholar
- 39.D.L. Misell: In Practical Methods in Electron Microscopy, Vol.7, ed. by M. Glauert ( North Holland, Amsterdam 1978 )Google Scholar
- 40.T. Mulvey: J. Microsc. 98, 232–250 (1973)CrossRefGoogle Scholar
- 41.L. Reimer: Elektronenmikroskopische Untersuchungs-und Präphrationsmethoden, 2nd ed. ( Springer, Berlin, Heidelberg, New York 1967 )CrossRefGoogle Scholar
- 42.L. Reimer, G. Pfefferkorn: Rasterelektronenmikroskopie, 2nd ed. ( Springer, Berlin, Heidelberg, New York 1973 )CrossRefGoogle Scholar
- 43.W.O. Saxton: Computer Techniques for Image Processing in Electron Microscopy ( Academic, New York 1978 )Google Scholar
- 44.W.O. Saxton, J. Frank: Ultramicroscopy 2, 219–227 (1977)CrossRefGoogle Scholar
- 45.G. Schimmel: Elektronenmikroskopische Methodik (Springer, Berlin, Heidelberg, New York 1969 )CrossRefGoogle Scholar
- 46.M. Schulz-Baldes, R. Lasch, S. Boseck: The EDAX-EDITor 8, 2, 17–18 (1978)Google Scholar
- 47.P. Sieber: Dissertation, Technische Universität Berlin (1978)Google Scholar
- 48.G.W. Stroke, M. Halioua, F. Thon, D.H. Willasch: Proc. IEEE 65, 39–62 (1977)ADSCrossRefGoogle Scholar
- 49.M. Themann: Mikroskopie 36, 276–318 (1980)Google Scholar
- 50.A. Toepfer, W. Jung, P. Liebherr, S. Boseck, A. Wasiljeff: Poster, 82. Jahrestg. Dt. Ges. angew. Optik, Bremen 1981Google Scholar
- 51.A. Wasiljeff, S. Boseck, R. Hilgendorf, G. Hoffmann, J. Pickelhan, J. Schmidt: “Design of Two-Dimensional Digital Filters for Electron Microscopy”, in Underwater Acoustics and Signal Processing, ed. by L. BjOrnd ( Reidel, Dordrecht 1981 ) pp. 551–557CrossRefGoogle Scholar
- 52.S.T. Wernecke, L.R. D’Addario: IEEE Trans. C-26, 351–364 (1177)Google Scholar
- 53.D. Willasch: Siemens Analysentechnische Mitteilungen No. 204Google Scholar
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© Springer-Verlag Berlin Heidelberg 1982