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Estimation of Scattering Loss Due to Sidewall Roughness in High Power Laser Diodes

  • Deepti JainEmail author
  • Somna Mahajan
  • Alok Jain
  • Manjeet Singh
  • Shabbir Mohammed
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 215)

Abstract

High power laser diodes are fabricated using two different etchants by wet etching method. Sidewall roughness of the stripe in two cases is extracted using AFM and scattering loss due to this roughness is calculated theoretically by using well established model and exponential autocorrelation function for the roughness.

Notes

Acknowledgements

Authors are grateful to Director SSPL, Dr. R. K. Sharma for continuous support and permission to publish this work. The authors also thank Characterization Group at SSPL for SEM and AFM. Special thanks to Akhilesh Pandey for valuable inputs on roughness extraction by AFM. We also thank our High Power Laser Diode Team at SSPL for fabrication of laser diodes used in the study and for helpful discussions.

References

  1. 1.
    M. Behringer, High power diode laser technology and characteristics, in High Power Diode Lasers, Springer Series in Optical Sciences, ed. by F. Bachmann, P. Loosen, R. Poprawe, vol. 128 (Springer, New York, 2007).Google Scholar
  2. 2.
    E. Jaberansary et al., Scattering loss estimation using 2D fourier analysis and modelling of sidewall roughness on optical waveguides. IEEE Photonics J. 5(3) (2013)ADSCrossRefGoogle Scholar
  3. 3.
    J.P.R. Lacey, F.P. Payne, Radiation loss from planar waveguides with random wall imperfections. IEE Proc. 137(4) (1990)CrossRefGoogle Scholar

Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  • Deepti Jain
    • 1
    Email author
  • Somna Mahajan
    • 1
  • Alok Jain
    • 1
  • Manjeet Singh
    • 1
  • Shabbir Mohammed
    • 1
  1. 1.Solid State Physics LaboratoryTimarpurIndia

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